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|a UAMI
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|a X-ray scattering /
|c Christopher M. Bauwens, editor.
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1 |
|a New York :
|b Nova Science Publishers, Inc.,
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|a Materials science and technologies
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|a Includes bibliographical references and index.
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0 |
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|a GISAXS -- probe of buried interfaces in multi-layered thin films / P. Siffalovic, M. Jergel, and E. Majkova -- In situ, real-time synchrotron x-ray scattering / Bridget Ingham -- Applications of x-ray scattering in edible lipid systems / Cristián Huck-Iriart, Noé Javier Morales-Mendoza, Roberto Jorge Candal and María Lidia Herrera -- Small angle x-ray scattering analysis of nanomaterials for ultra large scale integrated circuits / T. K. S. Wong and T. K. Goh -- X-ray scattering of bacterial cell wall compounds and their neutralization / Michael Rappolt, Manfred Rössle, Yani Kaconis, Jörg Howe, Jörg Andrä, Thomas Gutsmann, and Klaus Brandenburg -- Decomposition of WAXS diffractograms of semicrystalline polymers by simulated annealing / Gopinath Subramanian and Rahmi Ozisik -- Depth profile analysis of surface layer structure using x-ray diffraction and x-ray reflectivity at small glancing angles of incidence / Yoshikazu Fujii -- SAXS/WAXS characterization of sol-gel derived nanomaterials / Gang Chen.
|
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|a English.
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|a Radiography, Industrial.
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| 650 |
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|a X-rays
|x Scattering.
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6 |
|a Radiographie industrielle.
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| 650 |
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6 |
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7 |
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|x Scattering.
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1 |
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|a Bauwens, Christopher M.,
|e editor.
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8 |
|i Print version:
|t X-ray scattering
|d New York : Nova Science Publishers, Inc., [2012]
|z 9781613243268 (hardcover)
|w (DLC) 2011012584
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0 |
|a Materials science and technologies series.
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