High-power radio frequency effects on electronic systems

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Giri, D. V. (Autor), Hoad, Richard (Autor), Sabath, Frank (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Norwood, MA Artech House [2020]
Colección:Artech House electromagnetic analysis series.
Temas:
Electromagnetic compatibility.
Compatibilité électromagnétique.
Electromagnetic compatibility
Acceso en línea:Texto completo
Tabla de Contenidos:
  • High-Power Electromagnetic Effects on Electronic Systems
  • Contents
  • Foreword
  • Acknowledgments
  • 1 Introduction
  • 1.1 Reliance on Electronics
  • 1.2 HPEM Environment Overview
  • 1.3 HPEM Effects Overview
  • 1.4 A Brief History of EM Interference and Effects
  • 1.5 A Systems-of-Systems Hierarchy
  • 1.5.1 Device
  • 1.5.2 Circuit
  • 1.5.3 Equipment
  • 1.5.4 System
  • 1.5.5 Network
  • 1.5.6 Infrastructure
  • 1.6 Summary
  • References
  • 2 HPEM Environments
  • 2.1 Introduction
  • 2.2 Lightning
  • 2.2.1 Overview
  • 2.2.2 Lightning-Radiated Environment
  • 2.3 Nuclear EM Pulse
  • 2.3.1 HEMP-Radiated Environment
  • 2.3.2 HEMP-Conducted Environment
  • 2.3.3 Open-Source Accounts of HEMP Disturbances
  • 2.3.4 HEMP Environment Summary
  • 2.4 High-Power RF Directed Energy Environments
  • 2.4.1 The Status of HPRF DE Systems Today
  • 2.5 Intentional EM Interference Environments
  • 2.5.1 IEMI Technical Capability Groups
  • 2.5.2 IEMI Environment Summary
  • 2.5.3 Open-Source Accounts of HPRF DE and IEMI Action
  • 2.6 Classification of HPRF DE and IEMI Environments
  • 2.6.1 Hypoband
  • 2.6.2 Mesoband
  • 2.6.3 Hyperband
  • 2.7 Summary
  • References
  • 3 HPEM Coupling and Interaction
  • 3.1 EM Interaction Coupling Model
  • 3.2 Topological Concept
  • 3.3 Transfer Functions
  • 3.3.1 Antenna Transfer Function
  • 3.3.2 Free-Space Wave Propagation
  • 3.3.3 Coupling/Radiation Efficiency
  • 3.3.4 Diffusion Penetration
  • 3.3.5 Aperture Penetration
  • 3.3.6 Conducted Propagation
  • 3.3.7 Galvanic, Capacitive, and Magnetic Coupling
  • 3.3.8 Capacitive Coupling
  • 3.3.9 Inductive Coupling
  • 3.4 Field Variation Inside System Enclosure
  • 3.5 Overall Response
  • 3.5.1 Devices, Equipment, Systems, Networks, and Infrastructure
  • 3.5.2 Coupling as a Function of HPEM Environment Type
  • References
  • 4 Overview of HPEM Test Facilities and Techniques
  • 4.1 Introduction
  • 4.1.1 General Considerations for the Scenario
  • 4.1.2 General Considerations for HPEM Environment Simulation
  • 4.1.3 General Considerations of the SUT
  • 4.1.4 Summary
  • 4.2 Uncertainty in Effects Testing
  • 4.3 HPEM Effects Test Methods and Facilities
  • 4.3.1 HPEM-Radiated Testing
  • 4.3.2 HPEM-Radiated Test Facilities and HPEM Environment Simulation
  • 4.3.3 Measuring the Radiated HPEM Environment
  • 4.3.4 The Measurement Chain
  • 4.3.5 HPEM Conducted Testing
  • 4.3.6 Measuring the Conducted HPEM Environment
  • 4.4 Exercising and Observing the SUT
  • 4.5 Effects Data Presentation
  • 4.6 Other Practical Considerations for HPEM Effects Testing
  • 4.7 Summary
  • References
  • 5 HPEM Effects Mechanisms
  • 5.1 Introduction
  • 5.2 Terminology
  • 5.2.1 About This Chapter
  • 5.3 Device and Circuit-Level Effects
  • 5.3.1 Rectification
  • 5.3.2 Noise
  • 5.3.3 Interference or Jamming
  • 5.3.4 Saturation
  • 5.3.5 Shift in Operating Point
  • 5.3.6 False Information
  • 5.3.7 Transient Upset
  • 5.3.8 Chaotic Effects
  • 5.3.9 Damage and Destruction
  • 5.3.10 Published Device and Circuit-Level Effects Data

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