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cr cn||||||||| |
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200502s2020 mau ob 001 0 eng d |
040 |
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|a EBLCP
|b eng
|e rda
|e pn
|c EBLCP
|d CUV
|d N$T
|d OCLCO
|d OCLCF
|d UKAHL
|d YDX
|d K6U
|d OCLCO
|d OCLCQ
|d OCLCO
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019 |
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|a 1151504343
|a 1153998532
|a 1179922080
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020 |
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|a 9781630815899
|q electronic bk.
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020 |
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|a 1630815896
|q electronic bk.
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|z 9781630815882
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020 |
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|z 1630815888
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029 |
1 |
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|a AU@
|b 000069467555
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|a (OCoLC)1151184663
|z (OCoLC)1151504343
|z (OCoLC)1153998532
|z (OCoLC)1179922080
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050 |
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|a TK7867.2
|b .G57 2020
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|a 621.382/24
|2 23
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|a UAMI
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|a Giri, D. V.
|e author
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|a High-power radio frequency effects on electronic systems
|c D.V. Giri, Richard Hoad, Frank Sabath.
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|a Norwood, MA
|b Artech House
|c [2020]
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|a 1 online resource
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|a text
|b txt
|2 rdacontent
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337 |
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|a computer
|b c
|2 rdamedia
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338 |
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|a online resource
|b cr
|2 rdacarrier
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490 |
1 |
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|a Artech House electromagnetics series
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|a Description based on online resource; title from PDF title page (viewed on June 12, 2020)
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|a Includes bibliographical references and index
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|a High-Power Electromagnetic Effects on Electronic Systems -- Contents -- Foreword -- Acknowledgments -- 1 Introduction -- 1.1 Reliance on Electronics -- 1.2 HPEM Environment Overview -- 1.3 HPEM Effects Overview -- 1.4 A Brief History of EM Interference and Effects -- 1.5 A Systems-of-Systems Hierarchy -- 1.5.1 Device -- 1.5.2 Circuit -- 1.5.3 Equipment -- 1.5.4 System -- 1.5.5 Network -- 1.5.6 Infrastructure -- 1.6 Summary -- References -- 2 HPEM Environments -- 2.1 Introduction -- 2.2 Lightning -- 2.2.1 Overview -- 2.2.2 Lightning-Radiated Environment -- 2.3 Nuclear EM Pulse
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|a 2.3.1 HEMP-Radiated Environment -- 2.3.2 HEMP-Conducted Environment -- 2.3.3 Open-Source Accounts of HEMP Disturbances -- 2.3.4 HEMP Environment Summary -- 2.4 High-Power RF Directed Energy Environments -- 2.4.1 The Status of HPRF DE Systems Today -- 2.5 Intentional EM Interference Environments -- 2.5.1 IEMI Technical Capability Groups -- 2.5.2 IEMI Environment Summary -- 2.5.3 Open-Source Accounts of HPRF DE and IEMI Action -- 2.6 Classification of HPRF DE and IEMI Environments -- 2.6.1 Hypoband -- 2.6.2 Mesoband -- 2.6.3 Hyperband -- 2.7 Summary -- References -- 3 HPEM Coupling and Interaction
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|a 3.1 EM Interaction Coupling Model -- 3.2 Topological Concept -- 3.3 Transfer Functions -- 3.3.1 Antenna Transfer Function -- 3.3.2 Free-Space Wave Propagation -- 3.3.3 Coupling/Radiation Efficiency -- 3.3.4 Diffusion Penetration -- 3.3.5 Aperture Penetration -- 3.3.6 Conducted Propagation -- 3.3.7 Galvanic, Capacitive, and Magnetic Coupling -- 3.3.8 Capacitive Coupling -- 3.3.9 Inductive Coupling -- 3.4 Field Variation Inside System Enclosure -- 3.5 Overall Response -- 3.5.1 Devices, Equipment, Systems, Networks, and Infrastructure -- 3.5.2 Coupling as a Function of HPEM Environment Type
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|a References -- 4 Overview of HPEM Test Facilities and Techniques -- 4.1 Introduction -- 4.1.1 General Considerations for the Scenario -- 4.1.2 General Considerations for HPEM Environment Simulation -- 4.1.3 General Considerations of the SUT -- 4.1.4 Summary -- 4.2 Uncertainty in Effects Testing -- 4.3 HPEM Effects Test Methods and Facilities -- 4.3.1 HPEM-Radiated Testing -- 4.3.2 HPEM-Radiated Test Facilities and HPEM Environment Simulation -- 4.3.3 Measuring the Radiated HPEM Environment -- 4.3.4 The Measurement Chain -- 4.3.5 HPEM Conducted Testing
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|a 4.3.6 Measuring the Conducted HPEM Environment -- 4.4 Exercising and Observing the SUT -- 4.5 Effects Data Presentation -- 4.6 Other Practical Considerations for HPEM Effects Testing -- 4.7 Summary -- References -- 5 HPEM Effects Mechanisms -- 5.1 Introduction -- 5.2 Terminology -- 5.2.1 About This Chapter -- 5.3 Device and Circuit-Level Effects -- 5.3.1 Rectification -- 5.3.2 Noise -- 5.3.3 Interference or Jamming -- 5.3.4 Saturation -- 5.3.5 Shift in Operating Point -- 5.3.6 False Information -- 5.3.7 Transient Upset -- 5.3.8 Chaotic Effects -- 5.3.9 Damage and Destruction
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|a 5.3.10 Published Device and Circuit-Level Effects Data
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590 |
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|a eBooks on EBSCOhost
|b EBSCO eBook Subscription Academic Collection - Worldwide
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650 |
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|a Electromagnetic compatibility.
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650 |
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|a Compatibilité électromagnétique.
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650 |
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|a Electromagnetic compatibility
|2 fast
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700 |
1 |
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|a Hoad, Richard
|e author
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700 |
1 |
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|a Sabath, Frank
|e author
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776 |
0 |
8 |
|i Print version:
|a Giri, D. V.
|t High-Power Electromagnetic Effects on Electronic Systems
|d Norwood : Artech House, c2020
|z 9781630815882
|
830 |
|
0 |
|a Artech House electromagnetic analysis series.
|
856 |
4 |
0 |
|u https://ebsco.uam.elogim.com/login.aspx?direct=true&scope=site&db=nlebk&AN=2450271
|z Texto completo
|
938 |
|
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|a ProQuest Ebook Central
|b EBLB
|n EBL6176648
|
938 |
|
|
|a EBSCOhost
|b EBSC
|n 2450271
|
938 |
|
|
|a Askews and Holts Library Services
|b ASKH
|n AH37370427
|
938 |
|
|
|a YBP Library Services
|b YANK
|n 16736908
|
994 |
|
|
|a 92
|b IZTAP
|