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Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra /
This book presents a complex approach to material composition determination based on the analysis of the joint X-ray spectrum, including fluorescence, scattering, and diffraction reflections. It considers fluorescence, scattered, and diffracted radiations within the common problem of analytical spec...
| Clasificación: | Libro Electrónico |
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| Autor principal: | |
| Otros Autores: | , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Newcastle-upon-Tyne :
Cambridge Scholars Publisher,
2020.
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| Temas: | |
| Acceso en línea: | Texto completo |
| Sumario: | This book presents a complex approach to material composition determination based on the analysis of the joint X-ray spectrum, including fluorescence, scattering, and diffraction reflections. It considers fluorescence, scattered, and diffracted radiations within the common problem of analytical spectrum formation. The complex methods for analyzing the material composition by joint spectra of fluorescence, Compton scattering and diffraction proposed here allow for a widening of the area of the application of X-ray methods. The book will be useful for specialists in the field of solid state physi. |
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| Descripción Física: | 1 online resource (249 pages) |
| Bibliografía: | Includes bibliographical references (pages 231-237). |
| ISBN: | 1527543897 9781527543898 |