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|a Bonaguide, Gregory,
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|a The VNA applications handbook /
|c Gregory Bonaguide, Neil Jarvis
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| 264 |
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|a Norwood, MA :
|b Artech House,
|c [2019]
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| 300 |
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|a 1 online resource (online resource) :
|b illustrations
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|a text
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|a Artech House microwave library
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|a Print version record
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|a Includes bibliographical references and index
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|a The VNA Applications Handbook; Contents; Preface; 1 Architecture of the Modern Vector Network Analyzer; 1.1 What Is a Vector Network Analyzer?; 1.2 Wave Quantities and S-Parameters; 1.2.1 One-Port Measurements; 1.2.2 Two-Port Measurements; 1.3 Architecture of an N-Port Network Analyzer; 1.3.1 Main Blocks; 1.3.2 Errors; 1.3.3 Test Set Challenges; 1.4 Swept Versus Stepped Mode; 1.4.1 Chopped Versus Alternate Mode; 2 Calibration; 2.1 VNA Measurements in an Ideal World; 2.2 Measurement Errors in the Real World; 2.2.1 Random Errors; 2.2.2 Systematic Errors; 2.3 Calibration Standards
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|a 2.3.1 Open (O)2.3.2 Short (S); 2.3.3 Match (M); 2.3.4 Sliding Match (Sliding Load); 2.3.5 Thru (T); 2.3.6 Reflect (R); 2.3.7 Line (L); 2.3.8 Symmetrical Network (N); 2.3.9 Attenuator Standard (A); 2.3.10 Unknown Thru (U); 2.4 Calibration Techniques; 2.4.1 Normalization; 2.4.2 Full Single-Port Correction (OSM); 2.4.3 One-Path, Two-Port Correction; 2.4.4 Seven-Term Error Correction; 2.4.5 12-Term Error Correction; 2.5 Power Calibration; 2.5.1 Source Power Calibration; 2.5.2 Receiver Power Cal; 2.5.3 SMARTerCal; 2.5.4 Automatic Level Control (ALC); References; Selected Bibliography
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|a 3 Passive and Active One-Port Device Measurements3.1 Passive One-Port Devices; 3.1.1 Steps for Setting Up a Single-Port Measurement; 3.1.2 Calibration for Multiple Single-Port Devices; 3.1.3 Port Configuration for Multiple Simultaneous Single-Port Measurements; 3.2 Impedance Measurements; 3.2.1 Impedance Traces; 3.2.2 Impedance Markers; 3.3 Phase and Electrical Length Measurements; 3.3.1 Calibration Offset Method; 3.3.2 Group Delay Method; 3.4 Measurement Uncertainty for Passive One-Port Devices; 3.4.1 Directivity; 3.4.2 Source Match
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| 505 |
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|a 3.5 Active One-Port DUTs: Oscillators, VCOs, and Signal Generators3.5.1 Spurious Signals; 3.5.2 Heterodyne Images; 3.5.3 Receiver Compression/Overload; Reference; Selected Bibliography; Appendix 3A: Phase Wrap Resulting from an Offset Open or Offset Short Calibration Kit Standard; Appendix 3A.2: MATLAB Script for Generating Data for Offset Open and Short Standards Versus Frequency; 4 Passive Two-Port Device Measurements; 4.1 Passive Two-Port Devices; 4.1.1 Steps for Establishing a Two-Port Measurement Baseline; 4.1.2 Cable Measurements; 4.1.3 Filter Measurements
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|a 4.1.4 Passive Multiport Devices Measured as a Two-Port4.1.5 Switches: Time-Domain Transient Measurements; 4.1.6 Phase and Delay-Matching of Complex-Modulated Signals; Selected Bibliography; 5 Active Two-Port Device Measurements; 5.1 General-Purpose Amplifier Measurements; 5.1.1 Linear Measurements; 5.1.2 Nonlinear Measurements; 5.2 High-Power Amplifier Measurements; 5.2.1 Power Considerations for High-Power Calibration; 5.2.2 Power Calibration for High-Power Applications; 5.2.3 Adding an Attenuator to a Low-Power Sensor for High-Power Measurements; 5.2.4 Hot S22 Measurements
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|a Jarvis, Neil,
|e author.
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