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Optical metrology with interferometry /

The accurate measurements of surface topography are becoming important to many applications in both engineering and science. Optical interferometry is considered a preferable technique for featuring accurate 3D surface profiling since it is non-contacting, non-destructive and highly accurate. In com...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Ibrahim, Dahi Ghareab Abdelsalam (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Newcastle upon Tyne, UK : Cambridge Scholars Publishing, 2019.
Temas:
Acceso en línea:Texto completo
Descripción
Sumario:The accurate measurements of surface topography are becoming important to many applications in both engineering and science. Optical interferometry is considered a preferable technique for featuring accurate 3D surface profiling since it is non-contacting, non-destructive and highly accurate. In combination with computers and other electronic devices, optical interferometry has become faster, more reliable, more convenient and more robust. There is now a wealth of new optical interferometry techniques on the market, or being developed in academia, that can measure surface topography with high.
Descripción Física:1 online resource (viii, 302 pages)
Bibliografía:Includes bibliographical references.
ISBN:9781527537736
1527537730