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Means and Methods for Measurement and Monitoring : supplement book to advanced micro-device engineering VIII : selected, peer reviewed from the 8th International Conference on Advanced Micro-Device Engineering AMDE (2016), December 9, 2016, Kiryu, Japan /

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: International Conference on Advanced Micro Device Engineering
Otros Autores: Hanaizumi, Osamu
Formato: Electrónico Congresos, conferencias eBook
Idioma:Inglés
Publicado: Zurich, Switzerland : Trans Tech Publications, [2019]
Colección:Applied mechanics and materials ; v. 888.
Temas:
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Intro; Means and Methods for Measurement and Monitoring; Preface; Table of Contents; Analysis and Design of Operational Amplifier Stability Using Routh-Hurwitz Stability Criterion; Effect of Phase Error in Phase-Shifting Interferometer; Comparator Synthesis Using Distributed Genetic Algorithm and HSPICE Optimization; RC Polyphase Filter as Complex Analog Hilbert Filter; Rehabilitation Assistance Using Motion Capture Devices and Virtual Reality Feedback; Determination of Phase Shift by Digital Holography; Noise Filter for Surface Shape Measurement in Digital Holography
  • High-Frequency Low-Distortion One-Tone and Two-Tone Signal Generation Using Arbitrary Waveform GeneratorMulti-Valued PAM-N Data Transmission Using Double-Rate Tomlinson-Harashima Precoding; A Torque-Sensorless Viscometer for Food Processing Applications; Effect of Mass Added to a Force Transducer on the Dynamic-Force Correction Method; Another Implementation of Efficient Recoding Circuit for Signed Digit to Residue Canonical Signed Digit on Modulo 2n-1; Electron Density Measurement Using Multi-Energy X-Rays from a Conventional Laboratory X-Ray Source
  • A Study on Physically Based Maximum Electric Field Modeling Used for HCI Induced Degradation Characteristic of LDMOSKeyword Index; Author Index