Means and Methods for Measurement and Monitoring : supplement book to advanced micro-device engineering VIII : selected, peer reviewed from the 8th International Conference on Advanced Micro-Device Engineering AMDE (2016), December 9, 2016, Kiryu, Japan /
Clasificación: | Libro Electrónico |
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Autor Corporativo: | |
Otros Autores: | |
Formato: | Electrónico Congresos, conferencias eBook |
Idioma: | Inglés |
Publicado: |
Zurich, Switzerland :
Trans Tech Publications,
[2019]
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Colección: | Applied mechanics and materials ;
v. 888. |
Temas: | |
Acceso en línea: | Texto completo |
Tabla de Contenidos:
- Intro; Means and Methods for Measurement and Monitoring; Preface; Table of Contents; Analysis and Design of Operational Amplifier Stability Using Routh-Hurwitz Stability Criterion; Effect of Phase Error in Phase-Shifting Interferometer; Comparator Synthesis Using Distributed Genetic Algorithm and HSPICE Optimization; RC Polyphase Filter as Complex Analog Hilbert Filter; Rehabilitation Assistance Using Motion Capture Devices and Virtual Reality Feedback; Determination of Phase Shift by Digital Holography; Noise Filter for Surface Shape Measurement in Digital Holography
- High-Frequency Low-Distortion One-Tone and Two-Tone Signal Generation Using Arbitrary Waveform GeneratorMulti-Valued PAM-N Data Transmission Using Double-Rate Tomlinson-Harashima Precoding; A Torque-Sensorless Viscometer for Food Processing Applications; Effect of Mass Added to a Force Transducer on the Dynamic-Force Correction Method; Another Implementation of Efficient Recoding Circuit for Signed Digit to Residue Canonical Signed Digit on Modulo 2n-1; Electron Density Measurement Using Multi-Energy X-Rays from a Conventional Laboratory X-Ray Source
- A Study on Physically Based Maximum Electric Field Modeling Used for HCI Induced Degradation Characteristic of LDMOSKeyword Index; Author Index