Means and Methods for Measurement and Monitoring : supplement book to advanced micro-device engineering VIII : selected, peer reviewed from the 8th International Conference on Advanced Micro-Device Engineering AMDE (2016), December 9, 2016, Kiryu, Japan /

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: International Conference on Advanced Micro Device Engineering
Otros Autores: Hanaizumi, Osamu
Formato: Electrónico Congresos, conferencias eBook
Idioma:Inglés
Publicado: Zurich, Switzerland : Trans Tech Publications, [2019]
Colección:Applied mechanics and materials ; v. 888.
Temas:
Nanotechnology > Research > Congresses.
Microelectromechanical systems > Research > Congresses.
Miniature electronic equipment > Technological innovations > Congresses.
Microelectronics > Technological innovations > Congresses.
Mechatronics > Technological innovations > Congresses.
Microsystèmes électromécaniques > Recherche > Congrès.
Équipement électronique miniaturisé > Innovations > Congrès.
Microélectronique > Innovations > Congrès.
Mécatronique > Innovations > Congrès.
TECHNOLOGY & ENGINEERING > Engineering (General)
TECHNOLOGY & ENGINEERING > Reference.
Microelectronics > Technological innovations
Nanotechnology > Research
Conference papers and proceedings
Acceso en línea:Texto completo

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