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|a Means and Methods for Measurement and Monitoring :
|b supplement book to advanced micro-device engineering VIII : selected, peer reviewed from the 8th International Conference on Advanced Micro-Device Engineering AMDE (2016), December 9, 2016, Kiryu, Japan /
|c edited by Osamu Hanaizumi.
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| 264 |
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1 |
|a Zurich, Switzerland :
|b Trans Tech Publications,
|c [2019]
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| 300 |
|
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|a 1 online resource
|
| 336 |
|
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|a text
|b txt
|2 rdacontent
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|a computer
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|b cr
|2 rdacarrier
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| 490 |
1 |
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|a Applied mechanics and materials ;
|v volume 888
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| 504 |
|
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|a Includes bibliographical references.
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| 505 |
0 |
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|a Intro; Means and Methods for Measurement and Monitoring; Preface; Table of Contents; Analysis and Design of Operational Amplifier Stability Using Routh-Hurwitz Stability Criterion; Effect of Phase Error in Phase-Shifting Interferometer; Comparator Synthesis Using Distributed Genetic Algorithm and HSPICE Optimization; RC Polyphase Filter as Complex Analog Hilbert Filter; Rehabilitation Assistance Using Motion Capture Devices and Virtual Reality Feedback; Determination of Phase Shift by Digital Holography; Noise Filter for Surface Shape Measurement in Digital Holography
|
| 505 |
8 |
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|a High-Frequency Low-Distortion One-Tone and Two-Tone Signal Generation Using Arbitrary Waveform GeneratorMulti-Valued PAM-N Data Transmission Using Double-Rate Tomlinson-Harashima Precoding; A Torque-Sensorless Viscometer for Food Processing Applications; Effect of Mass Added to a Force Transducer on the Dynamic-Force Correction Method; Another Implementation of Efficient Recoding Circuit for Signed Digit to Residue Canonical Signed Digit on Modulo 2n-1; Electron Density Measurement Using Multi-Energy X-Rays from a Conventional Laboratory X-Ray Source
|
| 505 |
8 |
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|a A Study on Physically Based Maximum Electric Field Modeling Used for HCI Induced Degradation Characteristic of LDMOSKeyword Index; Author Index
|
| 588 |
0 |
|
|a Online resource; title from digital title page (viewed on May 01, 2019).
|
| 590 |
|
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|a eBooks on EBSCOhost
|b EBSCO eBook Subscription Academic Collection - Worldwide
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| 650 |
|
0 |
|a Nanotechnology
|x Research
|v Congresses.
|
| 650 |
|
0 |
|a Microelectromechanical systems
|x Research
|v Congresses.
|
| 650 |
|
0 |
|a Miniature electronic equipment
|x Technological innovations
|v Congresses.
|
| 650 |
|
0 |
|a Microelectronics
|x Technological innovations
|v Congresses.
|
| 650 |
|
0 |
|a Mechatronics
|x Technological innovations
|v Congresses.
|
| 650 |
|
6 |
|a Microsystèmes électromécaniques
|x Recherche
|v Congrès.
|
| 650 |
|
6 |
|a Équipement électronique miniaturisé
|x Innovations
|v Congrès.
|
| 650 |
|
6 |
|a Microélectronique
|x Innovations
|v Congrès.
|
| 650 |
|
6 |
|a Mécatronique
|x Innovations
|v Congrès.
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| 650 |
|
7 |
|a TECHNOLOGY & ENGINEERING
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| 655 |
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|a Conference papers and proceedings
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| 700 |
1 |
|
|a Hanaizumi, Osamu.
|
| 711 |
2 |
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|a International Conference on Advanced Micro Device Engineering
|n (8th :
|d 2016 :
|c Kiryū-shi, Japan)
|
| 776 |
0 |
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|i Print version:
|t Means and Methods for Measurement and Monitoring.
|d Zurich, Switzerland : Trans Tech Publications, [2019]
|z 303571553X
|z 9783035715538
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