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EBSCO_on1054065511 |
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OCoLC |
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20231017213018.0 |
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180922s2017 ohu ob 101 0 eng d |
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|a 1051682432
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|a 9781627081511
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|a International Symposium for Testing and Failure Analysis
|n (42nd :
|d 2016 :
|c Fort Worth, Tex.)
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|a ISTFA 2017 :
|b conference proceedings from the 43rd International Symposium for Testing and Failure Analysis : November 5-9, 2017, Pasadena Convention Center, Pasadena, California, USA /
|c organized by EDFAS, ISTFA/2017, ASM International.
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|a Materials Park, Ohio :
|b ASM International,
|c ©2017.
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|a 1 online resource (665 pages)
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|a Includes bibliographical references and index.
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|a Electronics
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|a Electronic apparatus and appliances
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|a Appareils électroniques
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|a ASM International.
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|a Electronic Device Failure Analysis Society.
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|i Print version:
|a International, A S M.
|t ISTFA(tm) 2017 Conference Proceedings from the 43rd International Symposium for Testing and Failure Analysis.
|d Materials Park : A S M International, ©2017
|z 9781627081504
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