Electron microscopy and analysis /
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context.
Clasificación: | Libro Electrónico |
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Autores principales: | Goodhew, Peter J. (Autor), Humphreys, F. J. (Autor), Beanland, R. (Autor) |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
Boca Raton :
CRC Press, Taylor & Francis Group,
2017.
|
Edición: | Third edition. |
Temas: | |
Acceso en línea: | Texto completo |
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