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Electron microscopy and analysis /

Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context.

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Goodhew, Peter J. (Autor), Humphreys, F. J. (Autor), Beanland, R. (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Boca Raton : CRC Press, Taylor & Francis Group, 2017.
Edición:Third edition.
Temas:
Acceso en línea:Texto completo

MARC

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100 1 |a Goodhew, Peter J.,  |e author. 
245 1 0 |a Electron microscopy and analysis /  |c Peter J. Goodhew, University of Liverpool, UK ; John Humphreys, Manchester Materials Science Centre, UK ; Richard Beanland, Marconi Materials Technology, Towcester, UK. 
250 |a Third edition. 
264 1 |a Boca Raton :  |b CRC Press, Taylor & Francis Group,  |c 2017. 
264 4 |c ©2001 
300 |a 1 online resource (x, 251 pages) :  |b illustrations 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
520 |a Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. 
504 |a Includes bibliographical references and index. 
505 0 |a Microscopy with light and electrons -- Electrons and their interaction with the specimen -- Electron diffraction -- The transmission electron microscope -- The scanning electron microscope -- Chemical analysis in the electron microscope -- Electron microscopy and other techniques. 
588 0 |a Print version record. 
590 |a eBooks on EBSCOhost  |b EBSCO eBook Subscription Academic Collection - Worldwide 
650 0 |a Electron microscopy. 
650 2 |a Microscopy, Electron 
650 6 |a Microscopie électronique. 
650 7 |a electron microscopy.  |2 aat 
650 7 |a SCIENCE  |x General.  |2 bisacsh 
650 7 |a Electron microscopy  |2 fast 
700 1 |a Humphreys, F. J.,  |e author. 
700 1 |a Beanland, R.,  |e author. 
776 0 8 |i Print version: GOODHEW, PETER J.  |t Electron microscopy and analysis, third edition.  |d [Place of publication not identified], CRC Press, 2017  |z 1138441538  |w (OCoLC)995776598 
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