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On-wafer microwave measurements and de-embedding /
This new authoritative resource presents the basics of network analyzer measurement equipment and troubleshooting errors involved in the on-wafer microwave measurement process. This book bridges the gap between theoretical and practical information using real-world practices that address all aspects...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Boston :
Artech House,
[2016]
|
| Colección: | Artech House microwave library.
|
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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| 003 | OCoLC | ||
| 005 | 20231017213018.0 | ||
| 006 | m o d | ||
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| 100 | 1 | |a Lourandakis, Errikos, |d 1981- |e author. | |
| 245 | 1 | 0 | |a On-wafer microwave measurements and de-embedding / |c Errikos Lourandakis. |
| 264 | 1 | |a Boston : |b Artech House, |c [2016] | |
| 300 | |a 1 online resource (xxvii, 216 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 1 | |a Artech House Microwave Library | |
| 588 | 0 | |a Print version record. | |
| 504 | |a Includes bibliographical references and index. | ||
| 520 | 3 | |a This new authoritative resource presents the basics of network analyzer measurement equipment and troubleshooting errors involved in the on-wafer microwave measurement process. This book bridges the gap between theoretical and practical information using real-world practices that address all aspects of on-wafer passive device characterization in the microwave frequency range up to 60GHz. Readers find data and measurements from silicon integrated passive devices fabricated and tested in advance CMOS technologies.nBasic circuit equations, terms and fundamentals of time and frequency domain analysis are covered. This book also explores the basics of vector network analyzers (VNA), two port S-parameter measurement routines, signal flow graphs, network theory, error models and VNA calibrations with the use of calibration standards. |c Publisher abstract. | |
| 590 | |a eBooks on EBSCOhost |b EBSCO eBook Subscription Academic Collection - Worldwide | ||
| 650 | 0 | |a Microwave integrated circuits. | |
| 650 | 0 | |a Microwave measurements. | |
| 650 | 6 | |a Circuits intégrés pour micro-ondes. | |
| 650 | 6 | |a Mesures micro-ondes. | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING |x Mechanical. |2 bisacsh | |
| 650 | 7 | |a Microwave integrated circuits |2 fast | |
| 650 | 7 | |a Microwave measurements |2 fast | |
| 776 | 0 | 8 | |i Print version: |a Lourandakis, Errikos, 1981- |t On-wafer microwave measurements and de-embedding. |d Boston ; London : Artech House, [2016] |z 9781630810566 |w (DLC) 2016288273 |w (OCoLC)946216728 |
| 830 | 0 | |a Artech House microwave library. | |
| 856 | 4 | 0 | |u https://ebsco.uam.elogim.com/login.aspx?direct=true&scope=site&db=nlebk&AN=1511845 |z Texto completo |
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