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Materials characterization using nondestructive evaluation methods /

Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prev...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Hübschen, Gerhard (Editor ), Altpeter, Iris (Editor ), Tschuncky, Ralf (Editor ), Herrmann, Hans-Georg (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Cambridge, MA : Woodhead Publishing, an imprint of Elsevier, 2016.
Colección:Woodhead Publishing series in electronic and optical materials ; 88.
Temas:
Acceso en línea:Texto completo
Descripción
Sumario:Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress.
Descripción Física:1 online resource
Bibliografía:Includes bibliographical references and index.
ISBN:9780081000571
008100057X