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A practical guide to transmission electron microscopy. Advanced microscopy / Volume II :
Transmission electron microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a scanning electron microscope, SEM, at several nanometers. The imaging resolution of the TEM, howe...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
New York [New York] (222 East 46th Street, New York, NY 10017) :
Momentum Press,
2016.
|
| Edición: | First edition. |
| Colección: | Materials characterization and analysis collection.
|
| Temas: | |
| Acceso en línea: | Texto completo |
Tabla de Contenidos:
- 6. Electron diffraction II
- 6.1 Kikuchi diffraction
- 6.1.1 Formation of Kikuchi lines
- 6.1.2 Kikuchi diffraction and crystal tilt
- 6.2 Convergent-beam electron diffraction
- 6.2.1 Formation of convergent-beam diffraction
- 6.2.2 High-order Laue zone
- 6.2.3 Experimental procedures
- 6.3 Nano-beam electron diffraction
- 6.3.1 Formation of nano-beam electron diffraction
- 6.3.2 Experimental procedures
- References.
- 7. Imaging II
- 7.1 STEM imaging
- 7.1.1 Formation of STEM images and optics
- 7.1.2 STEM experimental procedures
- 7.1.3 STEM applications
- 7.2 High-resolution transmission electron microscopy
- 7.2.1 Principles of HRTEM
- 7.2.2 Experimental operations
- 7.2.3 Image interpretation and simulation
- 7.2.4 Image processing
- References.
- 8. Elemental analyses
- 8.1 X-ray energy-dispersive spectroscopy
- 8.1.1 Formation of characteristic x-rays
- 8.1.2 EDS detector
- 8.1.3 EDS artifacts
- 8.1.4 Effects of specimen thickness, tilt, and space location
- 8.1.5 Experimental procedures
- 8.1.6 EDS applications
- 8.2 Electron energy-loss spectroscopy
- 8.2.1 Formation of EELS
- 8.2.2 EELS qualitative and quantitative analyses
- 8.2.3 Energy-filtered TEM
- 8.2.4 EFTEM experimentation and applications
- References.
- 9. Specific applications
- 9.1 Quantitative microscopy
- 9.1.1 Quantification of size homogeneity
- 9.1.2 Quantification of directional homogeneity
- 9.1.3 Dispersion quantification
- 9.1.4 Electron diffraction pattern processing and refinement
- 9.2 In situ microscopy
- 9.2.1 In situ heating
- 9.2.2 In situ cooling
- 9.2.3 In situ irradiation
- 9.3 Cryo-EM
- 9.4 Low-dose imaging
- 9.5 Electron tomography
- 9.5.1 Experimental procedures
- 9.5.2 Object shapes
- 9.5.3 Nanoparticle assemblies
- 9.5.4 Nanoparticle superlattices
- References
- Illustration credits
- Index.