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A practical guide to transmission electron microscopy. Advanced microscopy / Volume II :

Transmission electron microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a scanning electron microscope, SEM, at several nanometers. The imaging resolution of the TEM, howe...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Luo, Zhiping (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2016.
Edición:First edition.
Colección:Materials characterization and analysis collection.
Temas:
Acceso en línea:Texto completo

MARC

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100 1 |a Luo, Zhiping,  |e author. 
245 1 2 |a A practical guide to transmission electron microscopy.  |n Volume II :  |b Advanced microscopy /  |c Zhiping Luo. 
246 3 0 |a Advanced microscopy 
250 |a First edition. 
264 1 |a New York [New York] (222 East 46th Street, New York, NY 10017) :  |b Momentum Press,  |c 2016. 
300 |a 1 online resource (1 PDF (xiv, 155 pages)) :  |b illustrations 
336 |a text  |b txt  |2 rdacontent 
337 |a electronic  |2 isbdmedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 1 |a Materials characterization and analysis collection,  |x 2377-4355 
504 |a Includes bibliographical references and index. 
505 0 |a 6. Electron diffraction II -- 6.1 Kikuchi diffraction -- 6.1.1 Formation of Kikuchi lines -- 6.1.2 Kikuchi diffraction and crystal tilt -- 6.2 Convergent-beam electron diffraction -- 6.2.1 Formation of convergent-beam diffraction -- 6.2.2 High-order Laue zone -- 6.2.3 Experimental procedures -- 6.3 Nano-beam electron diffraction -- 6.3.1 Formation of nano-beam electron diffraction -- 6.3.2 Experimental procedures -- References. 
505 8 |a 7. Imaging II -- 7.1 STEM imaging -- 7.1.1 Formation of STEM images and optics -- 7.1.2 STEM experimental procedures -- 7.1.3 STEM applications -- 7.2 High-resolution transmission electron microscopy -- 7.2.1 Principles of HRTEM -- 7.2.2 Experimental operations -- 7.2.3 Image interpretation and simulation -- 7.2.4 Image processing -- References. 
505 8 |a 8. Elemental analyses -- 8.1 X-ray energy-dispersive spectroscopy -- 8.1.1 Formation of characteristic x-rays -- 8.1.2 EDS detector -- 8.1.3 EDS artifacts -- 8.1.4 Effects of specimen thickness, tilt, and space location -- 8.1.5 Experimental procedures -- 8.1.6 EDS applications -- 8.2 Electron energy-loss spectroscopy -- 8.2.1 Formation of EELS -- 8.2.2 EELS qualitative and quantitative analyses -- 8.2.3 Energy-filtered TEM -- 8.2.4 EFTEM experimentation and applications -- References. 
505 8 |a 9. Specific applications -- 9.1 Quantitative microscopy -- 9.1.1 Quantification of size homogeneity -- 9.1.2 Quantification of directional homogeneity -- 9.1.3 Dispersion quantification -- 9.1.4 Electron diffraction pattern processing and refinement -- 9.2 In situ microscopy -- 9.2.1 In situ heating -- 9.2.2 In situ cooling -- 9.2.3 In situ irradiation -- 9.3 Cryo-EM -- 9.4 Low-dose imaging -- 9.5 Electron tomography -- 9.5.1 Experimental procedures -- 9.5.2 Object shapes -- 9.5.3 Nanoparticle assemblies -- 9.5.4 Nanoparticle superlattices -- References -- Illustration credits -- Index. 
520 3 |a Transmission electron microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a scanning electron microscope, SEM, at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. Nowadays, TEM is widely applied in diverse areas in both physical sciences (chemistry, engineering, geosciences, materials science, and physics) and life sciences (agriculture, biology, and medicine), playing a key role in research or development for material design, synthesis, processing, or performance. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. It is written primarily for materials science and engineering or related disciplines, while some applications in life sciences are also included. It covers most of the areas using TEM, including the instrumentation, sample preparation, diffraction, imaging, analytical microscopy, and some newly developed advanced microscopy techniques. In each topic, a theoretical background is firstly briefly outlined, followed with step-by-step instructions in experimental operation or computation. Some technical tips are given in order to obtain the best results. The practical procedures to acquire, analyze, and interpret the TEM data are therefore provided. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills. 
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650 0 |a Transmission electron microscopy. 
650 6 |a Microscopie électronique à transmission. 
650 7 |a SCIENCE  |x General.  |2 bisacsh 
650 7 |a Transmission electron microscopy  |2 fast 
653 |a Analytical Electron Microscopy 
653 |a Ceramics 
653 |a Chemical Analysis 
653 |a Chemistry 
653 |a Composites 
653 |a Crystallography 
653 |a Electron Diffraction 
653 |a Electron Energy- Loss Spectroscopy (EELS) 
653 |a Forensic Science 
653 |a Geosciences 
653 |a Imaging 
653 |a Industry 
653 |a Life Sciences 
653 |a Materials Science and Engineering 
653 |a Metals and Alloys 
653 |a Microstructure 
653 |a Nanomaterials 
653 |a Nanoscience 
653 |a Nanotechnology 
653 |a Physics 
653 |a Scanning Transmission Electron Microscopy (STEM) 
653 |a Polymer 
653 |a Structure 
653 |a Transmission Electron Microscopy (TEM) 
653 |a X-ray Energy- Dispersive Spectroscopy (EDS) 
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