A practical guide to transmission electron microscopy : fundamentals /

Transmission electron microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a scanning electron microscope, SEM, at several nanometers. The imaging resolution of the TEM, howe...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Luo, Zhiping (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2016.
Edición:First edition.
Colección:Materials characterization and analysis collection.
Temas:
Transmission electron microscopy.
Microscopie électronique à transmission.
SCIENCE > General.
Analytical Electron Microscopy
Ceramics
Chemical Analysis
Chemistry
Composites
Crystallography
Electron Diffraction
Electron Energy- Loss Spectroscopy (EELS)
Forensic Science
Geosciences
Imaging
Industry
Life Sciences
Materials Science and Engineering
Metals and Alloys
Microstructure
Nanomaterials
Nanoscience
Nanotechnology
Physics
Scanning Transmission Electron Microscopy (STEM)
Polymer
Structure
Transmission Electron Microscopy (TEM)
X-ray Energy- Dispersive Spectroscopy (EDS)
Acceso en línea:Texto completo
Tabla de Contenidos:
  • 1. Introduction
  • 1.1 Microscope resolution
  • 1.2 Interactions of electrons with specimen
  • 1.3 Comparison of TEM with other microscopy techniques
  • References
  • 2. Sample preparation
  • 2.1 Material samples
  • 2.1.1 TEM grids
  • 2.1.2 Ion milling
  • 2.1.3 Electropolishing
  • 2.1.4 Focused ion beam
  • 2.1.5 Microtomy
  • 2.2 Biological samples
  • 2.2.1 Particulate samples
  • 2.2.2 Cells and tissue samples
  • References
  • 3. Instrumentation and operation
  • 3.1 Construction
  • 3.1.1 Electron gun
  • 3.1.2 Electromagnetic lens
  • 3.1.3 Condenser lenses and condenser apertures
  • 3.1.4 Objective lens and objective aperture
  • 3.1.5 Intermediate lens and diffraction aperture
  • 3.1.6 Projector lens
  • 3.1.7 Viewing screen and camera
  • 3.2 Instrument imperfections, alignments, corrections, and calibrations
  • 3.2.1 Beam shift and beam tilt
  • 3.2.2 Spherical aberration
  • 3.2.3 Chromatic aberration
  • 3.2.4 Depth of field and depth of focus
  • 3.2.5 Specimen height
  • 3.2.6 Astigmatism
  • 3.2.7 Aperture alignment
  • 3.2.8 Magnification calibration
  • 3.2.9 Camera length calibration
  • 3.2.10 Magnetic rotation calibration
  • 3.3 TEM operating procedures
  • 3.3.1 Startup
  • 3.3.2 Specimen loading and unloading
  • 3.3.3 Alignments
  • 3.3.4 Data recording
  • 3.3.5 Finishing
  • References
  • 4. Electron diffraction I
  • 4.1 Formation of electron diffraction
  • 4.2 Reciprocal space
  • 4.3 Indexing of electron diffraction patterns
  • 4.3.1 Indexing of powder patterns
  • 4.3.2 Indexing of single-crystal diffraction patterns
  • 4.3.3 Indexing of compound patterns: twins
  • 4.3.4 Indexing of compound patterns: multiple phases
  • 4.3.5 Indexing of compound patterns: double diffraction
  • 4.4 Experimental procedures
  • 4.5 Simulation of diffraction patterns
  • References
  • 5. Imaging I
  • 5.1 Imaging contrast
  • 5.2 Imaging with mass-thickness contrast
  • 5.3 Imaging with diffraction contrast
  • 5.3.1 Formation of diffraction contrast
  • 5.3.2 Central dark-field imaging
  • 5.3.3 Two-beam condition
  • 5.3.4 Bragg-diffracted beam intensity
  • 5.3.5 Thickness fringes
  • 5.3.6 Bend contours
  • 5.3.7 Weak-beam dark-field imaging
  • 5.3.8 Planar defects
  • 5.3.9 Dislocations
  • References
  • Appendices
  • Appendix I. SAED indexing table of primitive cubic structure
  • Appendix II. SAED indexing table of body-centered cubic structure
  • Appendix III. SAED indexing table of face-centered cubic structure
  • Appendix IV. SAED indexing table of close-packed hexagonal structure
  • Illustration credits
  • Index.

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