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A practical guide to transmission electron microscopy : fundamentals /

Transmission electron microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a scanning electron microscope, SEM, at several nanometers. The imaging resolution of the TEM, howe...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Luo, Zhiping (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2016.
Edición:First edition.
Colección:Materials characterization and analysis collection.
Temas:
Acceso en línea:Texto completo

MARC

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100 1 |a Luo, Zhiping.,  |e author. 
245 1 2 |a A practical guide to transmission electron microscopy :  |b fundamentals /  |c Zhiping Luo. 
250 |a First edition. 
264 1 |a New York [New York] (222 East 46th Street, New York, NY 10017) :  |b Momentum Press,  |c 2016. 
300 |a 1 online resource (1 PDF (xiv, 152 pages)) :  |b illustrations 
336 |a text  |b txt  |2 rdacontent 
337 |a electronic  |2 isbdmedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 1 |a Materials characterization and analysis collection,  |x 2377-4355 
500 |a Title from PDF title page (viewed on December 27, 2015). 
504 |a Includes bibliographical references and index. 
505 0 |a 1. Introduction -- 1.1 Microscope resolution -- 1.2 Interactions of electrons with specimen -- 1.3 Comparison of TEM with other microscopy techniques -- References 
505 8 |a 2. Sample preparation -- 2.1 Material samples -- 2.1.1 TEM grids -- 2.1.2 Ion milling -- 2.1.3 Electropolishing -- 2.1.4 Focused ion beam -- 2.1.5 Microtomy -- 2.2 Biological samples -- 2.2.1 Particulate samples -- 2.2.2 Cells and tissue samples -- References 
505 8 |a 3. Instrumentation and operation -- 3.1 Construction -- 3.1.1 Electron gun -- 3.1.2 Electromagnetic lens -- 3.1.3 Condenser lenses and condenser apertures -- 3.1.4 Objective lens and objective aperture -- 3.1.5 Intermediate lens and diffraction aperture -- 3.1.6 Projector lens -- 3.1.7 Viewing screen and camera -- 3.2 Instrument imperfections, alignments, corrections, and calibrations -- 3.2.1 Beam shift and beam tilt -- 3.2.2 Spherical aberration -- 3.2.3 Chromatic aberration -- 3.2.4 Depth of field and depth of focus -- 3.2.5 Specimen height -- 3.2.6 Astigmatism -- 3.2.7 Aperture alignment -- 3.2.8 Magnification calibration -- 3.2.9 Camera length calibration -- 3.2.10 Magnetic rotation calibration -- 3.3 TEM operating procedures -- 3.3.1 Startup -- 3.3.2 Specimen loading and unloading -- 3.3.3 Alignments -- 3.3.4 Data recording -- 3.3.5 Finishing -- References 
505 8 |a 4. Electron diffraction I -- 4.1 Formation of electron diffraction -- 4.2 Reciprocal space -- 4.3 Indexing of electron diffraction patterns -- 4.3.1 Indexing of powder patterns -- 4.3.2 Indexing of single-crystal diffraction patterns -- 4.3.3 Indexing of compound patterns: twins -- 4.3.4 Indexing of compound patterns: multiple phases -- 4.3.5 Indexing of compound patterns: double diffraction -- 4.4 Experimental procedures -- 4.5 Simulation of diffraction patterns -- References 
505 8 |a 5. Imaging I -- 5.1 Imaging contrast -- 5.2 Imaging with mass-thickness contrast -- 5.3 Imaging with diffraction contrast -- 5.3.1 Formation of diffraction contrast -- 5.3.2 Central dark-field imaging -- 5.3.3 Two-beam condition -- 5.3.4 Bragg-diffracted beam intensity -- 5.3.5 Thickness fringes -- 5.3.6 Bend contours -- 5.3.7 Weak-beam dark-field imaging -- 5.3.8 Planar defects -- 5.3.9 Dislocations -- References 
505 8 |a Appendices -- Appendix I. SAED indexing table of primitive cubic structure -- Appendix II. SAED indexing table of body-centered cubic structure -- Appendix III. SAED indexing table of face-centered cubic structure -- Appendix IV. SAED indexing table of close-packed hexagonal structure -- Illustration credits -- Index. 
520 3 |a Transmission electron microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a scanning electron microscope, SEM, at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. Nowadays, TEM is widely applied in diverse areas in both physical sciences (chemistry, engineering, geosciences, materials science, and physics) and life sciences (agriculture, biology, and medicine), playing a key role in research or development for material design, synthesis, processing, or performance. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. It is written primarily for materials science and engineering or related disciplines, while some applications in life sciences are also included. It covers most of the areas using TEM, including the instrumentation, sample preparation, diffraction, imaging, analytical microscopy, and some newly developed advanced microscopy techniques. In each topic, a theoretical background is firstly briefly outlined, followed with step-by-step instructions in experimental operation or computation. Some technical tips are given in order to obtain the best results. The practical procedures to acquire, analyze, and interpret the TEM data are therefore provided. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills. 
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650 0 |a Transmission electron microscopy. 
650 6 |a Microscopie électronique à transmission. 
650 7 |a SCIENCE  |x General.  |2 bisacsh 
650 7 |a Transmission electron microscopy.  |2 fast  |0 (OCoLC)fst01154860 
653 |a Analytical Electron Microscopy 
653 |a Ceramics 
653 |a Chemical Analysis 
653 |a Chemistry 
653 |a Composites 
653 |a Crystallography 
653 |a Electron Diffraction 
653 |a Electron Energy- Loss Spectroscopy (EELS) 
653 |a Forensic Science 
653 |a Geosciences 
653 |a Imaging 
653 |a Industry 
653 |a Life Sciences 
653 |a Materials Science and Engineering 
653 |a Metals and Alloys 
653 |a Microstructure 
653 |a Nanomaterials 
653 |a Nanoscience 
653 |a Nanotechnology 
653 |a Physics 
653 |a Scanning Transmission Electron Microscopy (STEM) 
653 |a Polymer 
653 |a Structure 
653 |a Transmission Electron Microscopy (TEM) 
653 |a X-ray Energy- Dispersive Spectroscopy (EDS) 
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