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Fundamentals of atomic force microscopy. Part I, Foundations /
"The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provi...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Singapore ; Hacksensack, NJ :
World Scientific Publishing Co. Pte. Ltd.,
[2016]
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| Colección: | Lessons from nanoscience ;
v. 4. |
| Temas: | |
| Acceso en línea: | Texto completo |