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Fundamentals of atomic force microscopy. Part I, Foundations /
"The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provi...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Singapore ; Hacksensack, NJ :
World Scientific Publishing Co. Pte. Ltd.,
[2016]
|
| Colección: | Lessons from nanoscience ;
v. 4. |
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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| 100 | 1 | |a Reifenberger, Ronald G., |e author. | |
| 245 | 1 | 0 | |a Fundamentals of atomic force microscopy. |n Part I, |p Foundations / |c Ronald Reifenberger. |
| 246 | 3 | |a Foundations | |
| 264 | 1 | |a Singapore ; |a Hacksensack, NJ : |b World Scientific Publishing Co. Pte. Ltd., |c [2016] | |
| 300 | |a 1 online resource | ||
| 336 | |a text |b txt |2 rdacontent | ||
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| 490 | 1 | |a Lessons from nanoscience ; |v vol. 4 | |
| 504 | |a Includes bibliographical references and index. | ||
| 588 | 0 | |a Online resource; title from digital title page (viewed on November 24, 2015). | |
| 505 | 0 | |a Preface; ... to the Student; Acknowledgments; 1. Introduction to Scanning Probe Microscopy; 1.1 Historical Perspective; 1.2 The Need for a Scanning Probe Microscope; 1.3 The Scanning Tunneling Microscope; 1.4 The Atomic Force Microscope; 1.5 Current Trends in Atomic Force Microscopy; 1.6 Chapter Summary; 1.7 Further Reading; 2. The Force between Molecules; 2.1 Evidence for Inter-Molecular Forces; 2.2 A Review of Relevant Electrostatics; 2.2.1 Coulomb's law for point charges; 2.2.2 Electrostatic potential energy; 2.3 The Forces that Hold Molecules and Solids Together. | |
| 505 | 8 | |a 2.4 Electrostatic Forces Lead to Stable Molecules2.5 Molecular Dipole Moments; 2.6 Dipole Moments in External Electric Fields; 2.7 Chapter Summary; 2.8 Further Reading; 2.9 Problems; 3. Simple Models for Molecule-Molecule Interactions; 3.1 The Interaction of an Ion with a Dipole; 3.1.1 An ion interacting with a fixed polar molecule; 3.1.2 An ion interacting with a polar molecule free to rotate; 3.1.3 Induction -- the polarization of a non-polar molecule; 3.1.4 The interaction of a point charge with a non-polar molecule; 3.2 Molecule-Molecule Interactions. | |
| 505 | 8 | |a 3.2.1 The interaction of two polar molecules3.2.2 The angle-averaged interaction between two polar molecules; 3.2.3 The interaction between a di-polar molecule and a non-polar molecule; 3.2.4 The interaction between two non-polar molecules; 3.3 The van der Waals Interaction; 3.4 Chapter Summary; 3.5 Further Reading; 3.6 Problems; 4. Van der Waals Interactions between Macroscopic Objects; 4.1 Integrating the van der Waals Interaction; 4.2 Surface Energy and Adhesion and Its Relation to Hamaker Constants; 4.2.1 Creating a flat surface; 4.2.2 The liquid-solid interface. | |
| 505 | 8 | |a 4.2.3 The solid-solid interface4.3 The Derjaguin Approximation; 4.4 Van der Waals Interactions from a Condensed Matter Perspective .; 4.5 The Frequency Dependent Dielectric Function; 4.6 Chapter Summary; 4.7 Further Reading; 4.8 Problems; 5. When the Tip Contacts the Substrate: Contact Mechanics; 5.1 Elasticity of Materials; 5.1.1 Young's modulus; 5.1.2 Poisson's ratio; 5.2 Contact Mechanics; 5.3 Hertz Contact Mechanics; 5.4 DMT Contact Mechanics; 5.5 JKR Contact Mechanics; 5.6 Maugis-Dugdale Theory; 5.7 The Tip-Sample Interaction; 5.8 Chapter Summary; 5.9 Further Reading; 5.10 Problems. | |
| 505 | 8 | |a 6. Quasi-Static Cantilever Mechanics6.1 The Deflection Spring Constant of a Thin Rectangular AFM Cantilever; 6.2 The Cantilever as a Dynamic Beam; 6.3 The Cantilever as a Vibrating Beam; 6.4 Thermal Vibrations of the Cantilever; 6.4.1 Describing random fluctuations of cantilever displacement; 6.4.2 The spectral power density; 6.4.3 A few signal processing applications; 6.5 Chapter Summary; 6.6 Further Reading; 6.7 Problems; 7. AFM System Components; 7.1 The Generic AFM System; 7.2 Transducing the Tip-Substrate Force; 7.3 Detecting Cantilever Deflection; 7.4 Detecting Cantilever Torsion. | |
| 520 | |a "The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM. Useful as a study guide to "Fundamentals of AFM", an online video course available at https://nanohub.org/courses/AFM1/ Suitable for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos)"-- |c Provided by publisher | ||
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