A one-semester course in modeling of VLSI interconnections /

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Quantitative understanding of the parasitic capacitances and inductances, and the resultant propagation delays and crosstalk phenomena associated with the metallic interconnections on the very large scale integrated (VLSI) circuits has become extremely important for the optimum design of the state-o...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Goel, Ashok K., 1953- (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Momentum Press, [2015]
Colección:Electronic circuits and semiconductor devices collection.
Temas:
Integrated circuits > Very large scale integration > Mathematical models.
Microelectronics > Mathematical models.
Circuits intégrés à très grande échelle > Modèles mathématiques.
Microélectronique > Modèles mathématiques.
TECHNOLOGY & ENGINEERING > Mechanical.
Integrated circuits > Very large scale integration > Mathematical models
Microelectronics > Mathematical models
Acceso en línea:Texto completo
Tabla de Contenidos:
  • A One-Semester Course in Modeling of VLSI Interconnections; Dedication; Table of Contents; Preface; Acknowledgments; CHAPTER 1: Introductory Concepts; CHAPTER 2: Modeling of Interconnection Resistances, Capacitances, and Inductances; CHAPTER 3: Modeling of Interconnection Delays; CHAPTER 4: Modeling of InterconnectionCrosstalk; CHAPTER 5: Modeling of Electromigration-Induced Interconnection Failure; CHAPTER 6: Other Interconnection Technologies; APPENDIX A: Tables of Constants; APPENDIX B: Method of Images; APPENDIX C: Method of Moments; APPENDIX D: Transmission Line Equations.
  • APPENDIX E: Miller's TheoremAPPENDIX F: Inverse Laplace Transformation Technique; Index; Ad page.

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