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ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA /

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Detalles Bibliográficos
Clasificación:	Libro Electrónico
Autor Corporativo:	International Symposium for Testing and Failure Analysis San Jose, Calif.
Formato:	Electrónico Congresos, conferencias eBook
Idioma:	Inglés
Publicado:	Materials Park, Ohio : ASM International, 2013.
Temas:	Electronics > Materials > Testing > Congresses. Electronic apparatus and appliances > Testing > Congresses. Appareils électroniques > Essais > Congrès. TECHNOLOGY & ENGINEERING > Mechanical. Electronic apparatus and appliances > Testing Electronics > Materials > Testing Conference papers and proceedings
Acceso en línea:	Texto completo

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