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Scanning transmission electron microscopy of nanomaterials : basics of imaging and analysis /

The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologi...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Tanaka, Nobuo, 1949- (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Hackensack, NJ : Imperial College Press, 2014.
Temas:
Acceso en línea:Texto completo

MARC

LEADER 00000cam a2200000 i 4500
001 EBSCO_ocn890146620
003 OCoLC
005 20231017213018.0
006 m o d
007 cr cnu---unuuu
008 140908s2014 nju ob 001 0 eng d
040 |a N$T  |b eng  |e rda  |e pn  |c N$T  |d YDXCP  |d IDEBK  |d CUS  |d CDX  |d OCLCF  |d COO  |d EBLCP  |d OCLCQ  |d AGLDB  |d OCLCQ  |d VTS  |d STF  |d M8D  |d OCLCQ  |d OCLCO  |d OCLCQ 
019 |a 890530123  |a 958391458 
020 |a 9781848167902  |q (electronic bk.) 
020 |a 1848167903  |q (electronic bk.) 
020 |z 9781848167896 
020 |z 184816789X 
029 1 |a DEBBG  |b BV043037022 
029 1 |a DEBSZ  |b 429952236 
035 |a (OCoLC)890146620  |z (OCoLC)890530123  |z (OCoLC)958391458 
050 4 |a QH212.S34  |b S23 2014eb 
072 7 |a SCI  |x 000000  |2 bisacsh 
082 0 4 |a 502.8/25  |2 23 
049 |a UAMI 
245 0 0 |a Scanning transmission electron microscopy of nanomaterials :  |b basics of imaging and analysis /  |c editor, Nobuo Tanaka, Nagoya University, Japan. 
264 1 |a Hackensack, NJ :  |b Imperial College Press,  |c 2014. 
300 |a 1 online resource 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
504 |a Includes bibliographical references and index. 
588 0 |a Print version record. 
505 0 |a Preface; Acknowledgments; Contents; List of Contributors; List of Abbreviations; List of Symbols; For Students and Beginners; Softwares for Simulation; Table of Values of Related Physical Constants; Table of Electron Wavelength; 1. Introduction; 1.1 Need for electron nanoprobe imaging; 1.2 Comparison of TEM, SEM, and STEM; 1.3 Advantages of STEM; 1.4 Application possibilities of STEM; 1.5 Brief introduction to the chapters in this book; References; 2. Historical Survey of the Development of STEM Instruments; 2.1 STEM from the 1930s to the 1960s; 2.2 Crewe's STEM. 
505 8 |a 2.3 Crewe's high-voltage STEM with aberration correction2.4 The STEMs of Strojnik, Le Poole, and Jouffrey; 2.5 Vacuum Generators' STEM; 2.6 Cowley's HB-5 STEM; 2.7 Hitachi STEM; 2.8 The Cavendish HB-5 STEM; 2.9 The Cornell STEM; 2.10 The Oak Ridge HB-501 STEM; 2.11 The IBM STEM; 2.12 Hitachi HD-2000 STEM; 2.13 Krivanek's aberration corrector; 2.14 The IBM and Oak Ridge HB-501 STEM with aberration corrector; 2.15 The Oak Ridge 300 kV STEM with aberration corrector; 2.16 The Daresbury STEM; 2.17 The 200 kV TEM-based STEM by JEOL and FEI; 2.18 The Oxford and Nagoya double-corrected STEM. 
505 8 |a 2.19 The 300 kV STEM at Jülich and Berkeley2.20 The Japanese aberration corrector for 200 kV STEM; 2.21 The advanced aberration-corrected TEM/STEM by JEOL; 2.22 The 300 kV TEM/STEM in the R005 project; 2.23 Hitachi aberration-corrected STEM; 2.24 The 200 kV dedicated STEM by NION; 2.25 The Japanese national project TEM/STEM for lower voltages; 2.26 High-voltage environmental STEM in Nagoya University; References; PART 1: BASIC KNOWLEDGE OF STEM; 3. Basics of STEM; 3.1 Basic knowledge of imaging by electrons; 3.2 Basic features of STEM imaging. 
505 8 |a 3.3 Fine electron probe formation in geometrical optics3.4 Wave optics for focusing by a convex lens and its wave aberration; 3.5 Basic design of STEM and its components; 3.6 Incoherent imaging in ADF-STEM; 3.6.1 Cowley's explanation; 3.6.2 Nellist's explanation; 3.7 Reciprocity between STEM and TEM; 3.8 Imaging modes of STEM; 3.9 Various kinds of image contrast in STEM and their theories; 3.9.1 Bright field contrast and lattice images with phase contrast; 3.9.2 Crewe's Z-contrast and its elemental mapping; 3.9.3 Pennycook's Z2-x contrast in ADF-STEM; 3.9.4 Depth-sectioning images in STEM. 
505 8 |a 3.9.5 ABF-STEM3.9.6 EELS and EDX elemental mapping in STEM; 3.9.7 Secondary electron imaging in STEM; 3.9.8 Scanning confocal electron microscopy (SCEM); 3.10 Prototypes of STEM; 3.11 Calculation of STEM image intensity; 3.11.1 Cowley-Moodie method; 3.11.1.1 Probe formation (Step 1); 3.11.1.2 Multislice calculation of dynamical diffraction of a probe in a crystal (Step 2); 3.11.1.3 Collection of diffraction intensity by detectors (Step 3); 3.11.1.4 Inclusion of inelastic scattering for STEM image intensity; 3.11.2 Bethe method. 
520 |a The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials. Contents: Introduction (N Tanak. 
590 |a eBooks on EBSCOhost  |b EBSCO eBook Subscription Academic Collection - Worldwide 
650 0 |a Scanning transmission electron microscopy. 
650 0 |a Nanostructured materials. 
650 6 |a Microscopie électronique à balayage et à transmission. 
650 6 |a Nanomatériaux. 
650 7 |a SCIENCE  |x General.  |2 bisacsh 
650 7 |a Nanostructured materials.  |2 fast  |0 (OCoLC)fst01032630 
650 7 |a Scanning transmission electron microscopy.  |2 fast  |0 (OCoLC)fst01106494 
700 1 |a Tanaka, Nobuo,  |d 1949-  |e editor. 
776 0 8 |i Print version:  |t Scanning transmission electron microscopy of nanomaterials  |z 9781848167896  |w (DLC) 2014028461  |w (OCoLC)884440153 
856 4 0 |u https://ebsco.uam.elogim.com/login.aspx?direct=true&scope=site&db=nlebk&AN=839689  |z Texto completo 
938 |a Coutts Information Services  |b COUT  |n 29748686 
938 |a ProQuest Ebook Central  |b EBLB  |n EBL1779673 
938 |a EBSCOhost  |b EBSC  |n 839689 
938 |a ProQuest MyiLibrary Digital eBook Collection  |b IDEB  |n cis29748686 
938 |a YBP Library Services  |b YANK  |n 12058371 
994 |a 92  |b IZTAP