Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China /

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Collection of selected, peer reviewed papers from the 2014 International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China. The 380 papers are grouped as follows: Chapter 1: Measurement Science, Methods and Techniques of Measurements, Chapter...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: International Conference on Measurement, Instrumentation and Automation Shanghai, China
Otros Autores: Yarlagadda, Prasad (Editor ), Kim, Yun-Hae (Editor )
Formato: Electrónico Congresos, conferencias eBook
Idioma:Inglés
Publicado: Zurich, Switzerland : Trans Tech Publications, [2014]
Colección:Applied mechanics and materials ; v. 568-570.
Temas:
Detectors > Congresses.
Measurement > Congresses.
Measuring instruments > Congresses.
Mesure > Congrès.
Mesure > Instruments > Congrès.
TECHNOLOGY & ENGINEERING > Technical & Manufacturing Industries & Trades.
Detectors
Measurement
Measuring instruments
Conference papers and proceedings
Acceso en línea:Texto completo
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Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China /
Publicado 2014
Texto completo
Electrónico Congresos, conferencias eBook
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