Cargando…

Thin film chemical vapor deposition in electronics : equipment, methodology, and thin film growth experience /

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Vasilʹev, V. I͡U. (Vladislav I͡Urʹevich) (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York : Nova Publishers, [2014]
Colección:Materials science and technologies series.
Temas:
Acceso en línea:Texto completo

MARC

LEADER 00000cam a2200000 i 4500
001 EBSCO_ocn883242321
003 OCoLC
005 20231017213018.0
006 m o d
007 cr cnu---unuuu
008 140709s2014 nyu ob 001 0 eng d
040 |a N$T  |b eng  |e rda  |e pn  |c N$T  |d E7B  |d YDXCP  |d OCLCQ  |d OCLCF  |d EBLCP  |d AGLDB  |d OCLCQ  |d VTS  |d AU@  |d STF  |d M8D  |d OCLCQ  |d VLY  |d AJS  |d OCLCQ  |d OCLCO  |d OCLCQ 
019 |a 985342241  |a 985403466  |a 1162059644 
020 |a 9781633211865  |q (electronic bk.) 
020 |a 163321186X  |q (electronic bk.) 
020 |z 9781633211506 
020 |z 1633211509 
029 1 |a AU@  |b 000053396262 
029 1 |a AU@  |b 000062329458 
029 1 |a DEBBG  |b BV043781690 
029 1 |a DEBSZ  |b 450745856 
035 |a (OCoLC)883242321  |z (OCoLC)985342241  |z (OCoLC)985403466  |z (OCoLC)1162059644 
050 4 |a TK7872.T55 
072 7 |a TEC  |x 009070  |2 bisacsh 
082 0 4 |a 621.3815  |2 23 
049 |a UAMI 
245 0 0 |a Thin film chemical vapor deposition in electronics :  |b equipment, methodology, and thin film growth experience /  |c editor, Vladislav Yu Vasilyev (Novosibirsk State Technical University, Russian Federation). 
264 1 |a New York :  |b Nova Publishers,  |c [2014] 
300 |a 1 online resource 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 1 |a Materials science and technologies series 
504 |a Includes bibliographical references and index. 
588 0 |a Print version record. 
505 0 |a THIN FILM CHEMICAL VAPOR DEPOSITION IN ELECTRONICS: EQUIPMENT, METHODOLOGY AND THIN FILM GROWTH EXPERIENCE; THIN FILM CHEMICAL VAPOR DEPOSITION IN ELECTRONICS: EQUIPMENT, METHODOLOGY AND THIN FILM GROWTH EXPERIENCE; Library of Congress Cataloging-in-Publication Data; CONTENTS; PREFACE; LIST OF ABBREVIATIONS; LIST OF IMPORTANT SYMBOLS; PART 1. CVD EQUIPMENT, PROCESS AND THIN FILM METHODOLOGY; Chapter 1: BASIC THIN FILM MATERIALS IN INTEGRATED CIRCUIT TECHNOLOGY; 1.1. INTRODUCTORY REVIEW; 1.2. BASIC THIN FILM MATERIALS IN INTEGRATED CIRCUITS; 1.3. BRIEF REVIEW OF THE AUTHOR EXPERIENCE. 
505 8 |a 1.4. THE GOAL OF THE MONOGRAPHREFERENCES; Chapter 2: GENERAL THIN FILM CVD CHARACTERIZATION; 2.1. BASIC DEFINITIONS; 2.2. TYPES OF THIN FILM CVD REACTIONS; 2.3. CHEMICAL COMPOUNDS USED FOR THIN FILM CVD; 2.4. THERMODYNAMIC ASPECTS OF CVD THIN FILM GROWTH; 2.5. THIN FILM CVD GAS DYNAMIC REGIMES; 2.6. GENERAL KINETIC ASPECTS OF CVD THIN FILM GROWTH; 2.7. BASIC CVD THIN FILM GROWTH FUNCTIONAL DEPENDENCES; 2.8. THIN FILM CVD DEVELOPMENT PROBLEMATICS; REFERENCES; Chapter 3: BASIC FLOW CVD REACTOR DESIGNS AND PROCESS METHODOLOGY; 3.1. CVD TOOL STUCTURE; 3.2. CVD REACTOR DESIGN. 
505 8 |a 3.3. BASIC THIN FILM CVD PROCESS PARAMETERS3.4. BASIC THIN FILM CVD PROCESS METHODOLOGY; REFERENCES; Chapter 4: PULSED CVD TOOLS AND PROCESS METHODOLOGY; 4.1. INTRODUCTORY REMARKS; 4.2. PULSED CVD TOOL DESING; 4.3. PULSED CVD TOOL VACUUM SYSTEM CHARACTERISTICS; 4.4. PULSED CVD TOOL GAS SYSTEM CHARACTERISTICS; 4.5. ROLE OF MFC IN PULSED CVD PROCESSES; 4.5. CONSECUTIVE PULSED CVD PROCESS METHODOLOGY; 4.6. WAFER TEMPERATURE; CONCLUSION; REFERENCES; Chapter 5: BRIEF REVIEW ON CVD THIN FILM ANALYSIS TECHNIQUES; 5.1. INTRODUCTORY REVIEW; 5.2. FILM THICKNESS; 5.3. FILM COMPOSITION. 
505 8 |a 5.4. FILM PROPERTIES5.5. FILM ELECTRICAL PROPERTIES; REFERENCES; Chapter 6: METHODOLOGY OF THIN FILM CVD KINETIC STUDIES; 6.1. GENERAL CONSIDERATIONS; 6.2. PRACTICAL IMPLEMENTATION OF THIN FILM CVD KINETIC METHODOLOGY FOR CVD PROCESSES ANALYSIS; 6.3. RESEARCH METHODOLOGY FOR LPCVD PRODUCTUION PROCESSES; 6.4. EXPERIMENTAL METHODOLOGY FOR SINGLE VAFER CHAMBER CVD PROCESSES; REFERENCES; PART 2. EXAMPLES OF THIN FILM GROWTH KINETICS STUDIES; Chapter 7: SEMICONDUCTOR THIN FILM CVD: POLYSILICON; 7.1. INTRODUCTORY REMARKS; 7.2. BASIC DATA ON MONOSILANE PYROLISYS KINETICS. 
505 8 |a 7.3. POLYSILICON GRAIN SIZE FEATURES7.4. THIN POLYCRYSTALLINE FILMS GROWTH IN PRODUCTION BATCH LPCVD REACTORS; 7.5. BRIEF VIEW ON THE POLYCRYSTALLINE FILMS GROWTH SCHEMES AND MECHANISMS; 7.6. PLASMA-ENHANCED POLYSILICON DEPOSITION; REFERENCES; Chapter 8: DIELECTRIC THIN FILM CVD: SILICON NITRIDE; 8.1. INTRODUCTORY REMARKS; 8.2. MONOSILANE-AMMONIA SYSTEM; 8.3. SILICON TETRACHLORIDE-AMMONIA SYSTEM; 8.4. DICHLOROSILANE-AMMONIA SYSTEM; 8.5. BRIEF VIEW ON THE SILICON NITRIDE THIN FILM GROWTH SCHEMES AND MECHANISMS; 8.6. PRODUCTION PROCESSES OF SILICON NITRIDE THIN FILM DEPOSITION; REFERENCES. 
546 |a English. 
590 |a eBooks on EBSCOhost  |b EBSCO eBook Subscription Academic Collection - Worldwide 
650 0 |a Thin film devices. 
650 0 |a Integrated circuits  |x Design and construction. 
650 0 |a Chemical vapor deposition. 
650 6 |a Dispositifs à couches minces. 
650 6 |a Circuits intégrés  |x Conception et construction. 
650 6 |a Dépôt chimique en phase vapeur. 
650 7 |a TECHNOLOGY & ENGINEERING  |x Mechanical.  |2 bisacsh 
650 7 |a Chemical vapor deposition.  |2 fast  |0 (OCoLC)fst00853229 
650 7 |a Integrated circuits  |x Design and construction.  |2 fast  |0 (OCoLC)fst00975545 
650 7 |a Thin film devices.  |2 fast  |0 (OCoLC)fst01150011 
700 1 |a Vasilʹev, V. I͡U.  |q (Vladislav I͡Urʹevich),  |e author. 
776 0 8 |i Print version:  |t Thin film chemical vapor deposition in electronics  |z 9781633211506  |w (DLC) 2014019878  |w (OCoLC)879603973 
830 0 |a Materials science and technologies series. 
856 4 0 |u https://ebsco.uam.elogim.com/login.aspx?direct=true&scope=site&db=nlebk&AN=801974  |z Texto completo 
938 |a ProQuest Ebook Central  |b EBLB  |n EBL3024440 
938 |a ebrary  |b EBRY  |n ebr10887680 
938 |a EBSCOhost  |b EBSC  |n 801974 
938 |a YBP Library Services  |b YANK  |n 11811577 
994 |a 92  |b IZTAP