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Measurement technology and intelligent instruments XI : selected, peer reviewed papers from the 11th International Symposium on Measurement Technology and Intelligent Instruments, (ISMTII 2013), July 1-3, 2013, Aachen, Germany /
Collection of selected, peer reviewed papers from the 11th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII 2013), July 1-3, 2013, Aachen, Germany. The 60 papers are grouped as follows: Chapter 1: Metrology for SI, Chapter 2: Position & Displacement Metrology...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor Corporativo: | |
| Otros Autores: | , |
| Formato: | Electrónico Congresos, conferencias eBook |
| Idioma: | Inglés |
| Publicado: |
Zürich, Switzerland :
Trans Tech Publications,
2014.
|
| Colección: | Key engineering materials ;
v. 613. |
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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| 111 | 2 | |a International Symposium on Measurement Technology and Intelligent Instruments |n (11th : |d 2013 : |c Aachen, Germany) | |
| 245 | 1 | 0 | |a Measurement technology and intelligent instruments XI : |b selected, peer reviewed papers from the 11th International Symposium on Measurement Technology and Intelligent Instruments, (ISMTII 2013), July 1-3, 2013, Aachen, Germany / |c edited by Robert Schmitt and Harald Bosse. |
| 264 | 1 | |a Zürich, Switzerland : |b Trans Tech Publications, |c 2014. | |
| 264 | 4 | |c ©2014 | |
| 300 | |a 1 online resource (491 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 1 | |a Key Engineering Materials, |x 1662-9795 ; |v Volume 613 | |
| 504 | |a Includes bibliographical references at the end of each chapters and indexes. | ||
| 588 | 0 | |a Online resource; title from PDF title page (ebrary, viewed June 20, 2014). | |
| 520 | |a Collection of selected, peer reviewed papers from the 11th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII 2013), July 1-3, 2013, Aachen, Germany. The 60 papers are grouped as follows: Chapter 1: Metrology for SI, Chapter 2: Position & Displacement Metrology, Chapter 3: Micro- and Nanometrology, Chapter 4: Macrometrology, Chapter 5: Optical Metrology, Chapter 6: Sensors and Actuators, Chapter 7: Material Properties' Characterization, Chapter 8: Intelligent Instruments for Automation, Chapter 9: Management of Measurement Processes, Chapter 10: Calibration and Machine Tool Performance, Chapter 11: Trends in Production Technology, Chapter 12: Measurements, Modeling and Simulation in the Humanitarian Field. | ||
| 505 | 0 | |a Measurement Technology and Intelligent Instruments XI; Editorial; Table of Contents; Chapter 1: Metrology for SI; Revision of the SI: The Determination of the Avogadro Constant as the Base for the Kilogram; Characterizing the New Sphere Interferometer for the Diameter Determination of the Avogadro Spheres; New Avogadro Spheres for the Redefinition of the Kilogram; Recommendations for Unified Rules for Key Comparison Evaluation; Chapter 2: Position & Displacement Metrology; Reproducibility of a Nanometre Accurate Moving-Scale Measurement System | |
| 505 | 8 | |a Error Separation and Dynamic Compensation Method in Coplanar Planar Grating Displacement Measurement SystemHighly-Stable Electronic Sensor Interface for Capacitive Position Measurement; Model and Measurement Method of Optical Nonlinearities Caused by the Heterodyne and Homodyne Interference Terms in the Heterodyne Interferometer; Orthogonality Measurement of Cross-Grating Based on Image Processing of Multi-Order Diffraction Patterns; Research on a Long Travel Nanopositioning Air Bearing Stage with the Linear Motors; Chapter 3: Micro- and Nanometrology | |
| 505 | 8 | |a Changing Technology Requirements of Mask Metrology in Semiconductor IndustryAutomated Tool for Measuring Nanotopography of 300 mm Wafers at early Stages of Wafer Production; Full Scale Calibration of a Combined Tactile Contour and Roughness Measurement Device; A Virtual Instrument for SEM Uncertainty Analysis; Chapter 4: Macrometrology; Super-Large Gear Measurement Using Laser Tracker and CMM; Experimental Performance Study of Industrial-Grade Coordinate Measuring Machines Using a Calibrated Production Workpiece; Analysis of a Big Joint Implant | |
| 505 | 8 | |a High Stability of Temperature Control Using Vacuum Insulated Wall for Gauge Block MeasurementChapter 5: Optical Metrology; First Utilization of Energy Transfer in Structured Light Projection -- Infrared 3D Scanner; High Precision Algorithms for 3D Objects Shadow Inspection in Partially Coherent Light; Measuring Parallelism for Two Thin Parallel Beams Based on Autocollimation Principle; Realization of Non-Mechanical Lateral and Axial Confocal Microscopic Laser Scanning with a Phase only Liquid Crystal Spatial Light Modulator | |
| 505 | 8 | |a An Approach to On-Line Uncertainty Evaluation in Non-Contact Temperature MeasurementsChapter 6: Sensors and Actuators; Design and Testing of Wind Energy Harvester Based on PVDF; Investigation of Energy Harvest Using a Piezoelectric Unimorph Post-Buckled by a Stretching Spring; Development of a Compact Deformable Mirror Using Push-Pull Actuators; Self-Diagnostics of Piezoelectric Transducers; Evaluation of the Transient Temperature Distribution of End-Face Sliding Friction Pair Using Infrared Thermometry; IEEE 1451-Based Sensor Interfacing and Data Fusion for Fire Smoke Detection | |
| 590 | |a eBooks on EBSCOhost |b EBSCO eBook Subscription Academic Collection - Worldwide | ||
| 650 | 0 | |a Engineering instruments |v Congresses. | |
| 650 | 0 | |a Measuring instruments |v Congresses. | |
| 650 | 6 | |a Ingénierie |x Instruments |v Congrès. | |
| 650 | 6 | |a Mesure |x Instruments |v Congrès. | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING |x Engineering (General) |2 bisacsh | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING |x Reference. |2 bisacsh | |
| 650 | 7 | |a Engineering instruments. |2 fast |0 (OCoLC)fst00910572 | |
| 650 | 7 | |a Measuring instruments. |2 fast |0 (OCoLC)fst01013181 | |
| 655 | 7 | |a Conference papers and proceedings. |2 fast |0 (OCoLC)fst01423772 | |
| 700 | 1 | |a Schmitt, Robert |c (Engineer), |e editor. | |
| 700 | 1 | |a Bosse, Harald, |e editor. | |
| 776 | 0 | 8 | |i Print version: |a International Symposium on Measurement Technology and Intelligent Instruments (11th : 2013 : Aachen, Germany). |t Measurement technology and intelligent instruments XI : selected, peer reviewed papers from the 11th International Symposium on Measurement Technology and Intelligent Instruments, (ISMTII 2013), July 1-3, 2013, Aachen, Germany. |d Zürich, Switzerland : Trans Tech Publications, ©2014 |h 499 pages |k Key engineering materials ; Volume 613 |x 1662-9795 |z 9783038351122 |
| 830 | 0 | |a Key engineering materials ; |v v. 613. | |
| 856 | 4 | 0 | |u https://ebsco.uam.elogim.com/login.aspx?direct=true&scope=site&db=nlebk&AN=792219 |z Texto completo |
| 938 | |a ProQuest Ebook Central |b EBLB |n EBL1910808 | ||
| 938 | |a ebrary |b EBRY |n ebr10879457 | ||
| 938 | |a EBSCOhost |b EBSC |n 792219 | ||
| 938 | |a Trans Tech Publications, Ltd |b TRAN |n 10.4028/www.scientific.net/KEM.613 | ||
| 938 | |a YBP Library Services |b YANK |n 11846985 | ||
| 994 | |a 92 |b IZTAP | ||