Istfa 2009 : CONFERENCE PROCEEDINGS FROM THE 35TH INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS.

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS (35TH: 2009: SAN JOSE, CALIF.)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: MATERIALS PARK: ASM INTERNATIONAL 2009.
Colección:ISTFA. PROCEEDINGS. 2009
Temas:
Electronic apparatus and appliances > Testing > Congresses.
Electronics > Materials > Testing > Congresses.
Appareils électroniques > Essais > Congrès.
TECHNOLOGY & ENGINEERING > Mechanical.
Electronic apparatus and appliances > Testing
Electronics > Materials > Testing
Conference papers and proceedings
Acceso en línea:Texto completo
Tabla de Contenidos:
  • IPFA 09 Best Paper; Session 1: Emerging Concepts; Session 2: Photon Beam Based Techniques
  • 1; Session 3: Nanoprobing; Session 4: Circuit-Edit; Session 5: Sample Preparation; Session 6: Alternative Energy; Session 7: Posters; Session 8: Photon Beam Based Techniques
  • 2; Session 9: Package and Assembly Level FA; Session 10: Failure Analysis Process; Session 11: Advanced Metrology and System Level FA; Author Index.

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