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00000cam a22000003a 4500 |
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EBSCO_ocn870663323 |
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OCoLC |
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20231017213018.0 |
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m o d |
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140217s2014 sz a ob 101 0 eng d |
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|a YDXCP
|b eng
|e pn
|c YDXCP
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|d OCLCQ
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|a 3038262056
|q (electronic bk.)
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|a 9783038262053
|q (electronic bk.)
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|z 9783037858240
|q (paperback)
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|z 3037858249
|q (paperback)
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1 |
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|a DEBBG
|b BV043777550
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|a DEBSZ
|b 472811649
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|a (OCoLC)870663323
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050 |
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|a TK7871.85
|b .G426 2013
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|a TEC
|x 009070
|2 bisacsh
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0 |
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|a 621.3815/2
|2 23
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|a UAMI
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|a Gettering and Defect Engineering in Semiconductor Technology Conference
|n (15th :
|d 2013 :
|c Oxford, Great Britain)
|
245 |
1 |
0 |
|a Gettering and defect engineering in semiconductor technology XV :
|b selected papers from the 15th Gettering and Defect Engineering in Semiconductor Technology Conference, September 22-27, 2013, Oxford, UK /
|c edited by J.D. Murphy.
|
246 |
3 |
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|a Gettering and defect engineering in semiconductor technology 15
|
264 |
|
1 |
|a Durnten-Zurich :
|b Trans Tech publications Ltd,
|c [2014]
|
300 |
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|a 1 online resource (xiv, 516 pages) :
|b illustrations (black and white
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336 |
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|a text
|b txt
|2 rdacontent
|
337 |
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|a computer
|b c
|2 rdamedia
|
338 |
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|a online resource
|b cr
|2 rdacarrier
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490 |
1 |
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|a Diffusion and defect data. Pt. B, Solid state phenomena,
|x 1012-0394 ;
|v volumes 205/206
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504 |
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|a Includes bibliographical references and index.
|
588 |
0 |
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|a Print version record.
|
590 |
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|a eBooks on EBSCOhost
|b EBSCO eBook Subscription Academic Collection - Worldwide
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650 |
|
0 |
|a Semiconductors
|x Defects
|v Congresses.
|
650 |
|
0 |
|a Getters
|v Congresses.
|
650 |
|
6 |
|a Semi-conducteurs
|x Défauts
|v Congrès.
|
650 |
|
6 |
|a Getters
|v Congrès.
|
650 |
|
7 |
|a TECHNOLOGY & ENGINEERING
|x Mechanical.
|2 bisacsh
|
650 |
|
7 |
|a Getters.
|2 fast
|0 (OCoLC)fst00942299
|
650 |
|
7 |
|a Semiconductors
|x Defects.
|2 fast
|0 (OCoLC)fst01112211
|
655 |
|
7 |
|a Conference papers and proceedings.
|2 fast
|0 (OCoLC)fst01423772
|
700 |
1 |
|
|a Murphy, J. D.,
|e editor.
|
776 |
0 |
8 |
|i Print version:
|z 9783037858240
|z 3037858249
|
830 |
|
0 |
|a Diffusion and defect data.
|n Pt. B,
|p Solid state phenomena ;
|v v. 205/206.
|
856 |
4 |
0 |
|u https://ebsco.uam.elogim.com/login.aspx?direct=true&scope=site&db=nlebk&AN=663767
|z Texto completo
|
938 |
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|b EBSC
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938 |
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|a YBP Library Services
|b YANK
|n 11355454
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