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|a UAMI
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|a Defects and diffusion in semiconductors.
|n XI :
|b an annual retrospective /
|c D.J. Fisher.
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|a Stafa-Zuerich, Switzerland :
|b TTP, Trans Tech Publications,
|c [2008]
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|c ©2008
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|a 1 online resource (154 pages) :
|b illustrations
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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|a online resource
|b cr
|2 rdacarrier
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|a Defects and diffusion forum,
|x 1012-0386 ;
|v v. 282
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|a Includes bibliographical references and indexes.
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|a Online resource; title from PDF title page (ebrary, viewed November 01, 2013).
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|a Defects and Diffusion in Semicondutors, 2009; Table of Contents; Structural and Electron-Hopping Studies of Pr and Nd Substituted La2/3Ba1/3MnO3 Manganites; Recrystallization Annealing of Cold Rolled 9Cr 1Mo Ferritic Steel Containing Silicon; Quantitative Concept for Morphological Stability Analysis of Liquid-Solid Interface in Rapid Solidification of Dilute Binary Alloys; Studies of the Spin Hamiltonian Parameters for NiX2 and CdX2:Ni2+ (X=Cl, Br); Abstracts; Keywords Index; Authors Index.
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|a This eleventh volume in the series covering the latest results in the field includes abstracts of papers which have appeared since the publication of Annual Retrospective X (Volume 272). As well as the 295 metals abstracts, the issue includes - in line with the new editorial policy of including original papers on all of the major material groups: ""Structural and Electron-Hopping Studies of Pr- and Nd-Substituted La2/3Ba1/3MnO3 Manganites"" (H. Abdullah and S.A. Halim), ""Recrystallization Annealing of Cold-Rolled 9Cr-1Mo Ferritic Steel Containing Silicon"" (M.N. Mungole, M. Surender, R. Balasubram
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|a Semiconductors
|x Defects.
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|a Semiconductors
|x Diffusion.
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|a Semi-conducteurs
|x Défauts.
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|x Electronics
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|2 bisacsh
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|x Defects.
|2 fast
|0 (OCoLC)fst01112211
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|a Semiconductors
|x Diffusion.
|2 fast
|0 (OCoLC)fst01112215
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700 |
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|a Fisher, D. J.
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776 |
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|i Print version:
|a Fisher, David J.
|t Defects and Diffusion in Semicondutors, 2009 : An Annual Retrospective XI.
|d Zurich : Trans Tech Publishers, ©2009
|z 9783908451631
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830 |
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|a Diffusion and defect data.
|n Pt. A,
|p Defect and diffusion forum ;
|v v. 282.
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