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Recent advances in topography research /

The book at hand covers many of the different classes of topography/profilometry, and will give the reader an overview of different aspects of current profilometric methods. The intent is to show the possibilities, the state-of-the-art and some recent advances in the field by bringing together a non...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York : Nova Science Publishers, Inc., [2013]
Colección:Engineering tools, techniques and tables
Temas:
Acceso en línea:Texto completo

MARC

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245 0 0 |a Recent advances in topography research /  |c Jan Buytaert, editor. 
264 1 |a New York :  |b Nova Science Publishers, Inc.,  |c [2013] 
300 |a 1 online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 0 |a Engineering tools, techniques and tables 
504 |a Includes bibliographical references and index. 
505 0 |a Calibration and adjustment of areal surface topography measuring instruments / Richard Leach and Claudiu Giusca -- Superfast 3D shape measurement with binary dithering techniques / Yajun Wang, Beiwen Li and Song Zhang -- High-resolution temporal profilometry using fourier estimation / B. Ribbens, V. A. Jacobs, C. Vuye, J. A. N. Buytaert, J. J. J. Dirckx and S. Vanlanduit -- Single-shot phase analysis by the sampling moiré method and its application to displacement measurement / Shien Ri and Motoharu Fujigaki -- Validation of an experimental low-cost projection moiré profilometer for 3D surface imaging of anatomical models of the middle third of the face / Andreas Artopoulos, Trevor J. Coward, Joris J. J. Dirckxand J. A. N. Buytaert -- High-speed fourier transform profilometry for reconstructing objects having arbitrary surface colours / Liang-Chia Chen -- Large-volume optical coherence tomography with real-time correction of geometric distortion artifacts / Sam Van der Jeught, J. A. N. Buytaert, Adrian Bradu, Adrian Gh. Podoleanu and Joris J. J. Dirckx -- Morphological characterization of biomaterials using atomic force microscopy / Kyung Sook Kimand Hun-Kuk Park -- A device for endoscopic measurements of forming tools with filigree side elements / Christoph Ohrt, Steffen Matthias, Markus Kästner and Eduard Reithmeier -- Omnidirectional vision system with conic mirror for on-line quality measurements on quasi-cylindrical cavities / L. Stroppa, A. Bastari, G. Angione and N. Paone -- A review on commercial solid state 3D cameras for machine vision applications / S. Hussmann, M. Gonschior, B. Büttgen, C. Peter,S. Schwope, C. Perwass, M. Johannesson and E. Hällstig -- Time of flight cameras (3D Vision) / Luc Mertens, Rudi Penne and Bart Ribbens. 
588 |a Description based on print version record. 
520 |a The book at hand covers many of the different classes of topography/profilometry, and will give the reader an overview of different aspects of current profilometric methods. The intent is to show the possibilities, the state-of-the-art and some recent advances in the field by bringing together a non-exhaustive but diverse selection of profilometric methods. Some methods are fresh and unique like the one pixel profilometer or the sampling moiré method. Others are more consolidated, like Fourier transform profilometry but now in real-time, and even commercially available, like the newest time-of. 
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650 0 |a Surfaces (Technology)  |x Measurement. 
650 0 |a Three-dimensional display systems. 
650 0 |a Surfaces (Technology)  |x Analysis. 
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650 7 |a Surfaces (Technology)  |x Measurement.  |2 fast  |0 (OCoLC)fst01139287 
650 7 |a Three-dimensional display systems.  |2 fast  |0 (OCoLC)fst01150324 
700 1 |a Buytaert, Jan,  |e editor of compilation. 
776 0 8 |i Print version:  |t Recent advances in topography research  |d New York : Nova Science Publishers, Inc., [2013]  |z 9781626188402 (hardcover)  |w (DLC) 2013018511 
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