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Orientation of single crystals by back-reflection Laue pattern simulation /
Laue-grams are the easiest X-ray diffraction patterns that can be obtained and are very useful for orienting single crystals and finding out the symmetry of a projection. Despite the simplicity of the experimental equipment, the orientation work is a costly and time consuming process. It would be a...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Singapore ; River Edge, N.J. :
World Scientific,
©1999.
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| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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| 100 | 1 | |a Marín, C. |q (Carlos), |d 1970- | |
| 245 | 1 | 0 | |a Orientation of single crystals by back-reflection Laue pattern simulation / |c C. Marín & E. Diéguez. |
| 260 | |a Singapore ; |a River Edge, N.J. : |b World Scientific, |c ©1999. | ||
| 300 | |a 1 online resource (xiii, 164 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 500 | |a Some online versions lack accompanying media packaged with the printed version. | ||
| 504 | |a Includes bibliographical references (pages 159-161) and index. | ||
| 588 | 0 | |a Print version record. | |
| 505 | 0 | |a NOTE FROM AUTHORS; PREFACE; CONTENTS; CHAPTER 1 X-RAY DIFFRACTION BY CRYSTAL LATTICES; 1.1 Production of X-rays; 1.2 Detection of X-rays; 1.3 Crystal geometry; 1.3.1 Classification of crystallographic systems; 1.3.2 Miller indices and the reciprocal lattice; 1.4 Scattering by an atom; 1.5 Diffraction by lattices and the Bragg law; CHAPTER 2 BACK-REFLECTION LAUE TECHNIQUE; 2.1 Geometry of the back-reflection Laue technique; 2.2 Applications of the back-reflection Laue technique; 2.3 Factors which determine the diffraction intensities in the back-reflection Laue patterns. | |
| 505 | 8 | |a 2.3.1 Incident radiation2.3.2 Film detector; 2.3.3 Structure factor (F); 2.3.4 Temperature factor; 2.3.5 Anomalous dispersion; 2.3.6 Polarization factor; 2.3.7 Absorption factor; 2.3.8 Lorentz factor; CHAPTER 3 DEVELOPMENT OF THE COMPUTATIONAL PROCEDURES FOR THE SIMULATION AND INDEXING OF BACK-REFLECTION LAUE PATTERNS; 3.1 Geometrical simulation procedure; 3.2 Estimation of intensities procedure; 3.2.1 Procedure for the estimation of intensities; 3.2.2 Results and comments about the estimation of intensities. | |
| 505 | 8 | |a 3.2.2.a Comparison between the simulation of back-reflection patterns with and without estimation of intensities3.2.2.b Filtering amd characteristic limes effects; 3.2.2.c Exposure time effects; 3.2.2. d Film detector effects; 3.2.2.e Distinction of anisotropic orientations; 3.3 Indexing method; 3.3.1 Indexing procedure; 3.3.2 Indexing result; 3.3.3 Strategy for the indexing work; CHAPTER 4 PROGRAMMING AND USE OF THE SUPPLIED SOFTWARE; 4.1 Code development; 4.2 Hardware specifications and installation procedure; 4.3 User manual; 4.3.1 Input of the geometrical data; 4.3.2 Selection of the job. | |
| 505 | 8 | |a 4.3.3 Simulation4.3.4 Indexing; CHAPTER 5 COMPARISON AND DISCUSSION BETWEEN SIMULATED AND EXPERIMENTAL PATTERNS OF SAMPLES OF THE SEVEN CRYSTAL LATTICE; 5.1 Cubic: GaSb; 5.2 Tetragonal: KH2PO4; 5.3 Orthorhombic: KTiOPO4; 5.4 Monoclinic: (CH2NH2COOH)3H2SO4; 5.5 Hexagonal: ZnO; 5.6 Rhombohedral: LiNbO3; 5.7 Triclinic: Na2W4O13; APPENDICES; A1 The 230 Space Groups; A2 Crystal structures data; LIST OF SYMBOLS; REFERENCES; SUBJECT INDEX. | |
| 520 | |a Laue-grams are the easiest X-ray diffraction patterns that can be obtained and are very useful for orienting single crystals and finding out the symmetry of a projection. Despite the simplicity of the experimental equipment, the orientation work is a costly and time consuming process. It would be a great advantage to be able to simulate any kind of Laue-gram and to identify an unknown crystal orientation, including anisotropic ones. This book presents the complete numerical algorithms for simulation of X-ray back-reflection Laue-grams by evaluating the main factors that affect the intensities o. | ||
| 590 | |a eBooks on EBSCOhost |b EBSCO eBook Subscription Academic Collection - Worldwide | ||
| 650 | 0 | |a X-ray crystallography. | |
| 650 | 2 | |a Crystallography, X-Ray | |
| 650 | 6 | |a Radiocristallographie. | |
| 650 | 7 | |a SCIENCE |x Physics |x Crystallography. |2 bisacsh | |
| 650 | 7 | |a X-ray crystallography |2 fast | |
| 650 | 7 | |a Computersimulation |2 gnd | |
| 650 | 7 | |a Kristallorientierung |2 gnd | |
| 650 | 7 | |a Laue-Diagramm |2 gnd | |
| 650 | 7 | |a Laue-Verfahren |2 gnd | |
| 650 | 7 | |a Röntgenstrukturanalyse |2 gnd | |
| 700 | 1 | |a Diéguez, E. |q (Ernesto) | |
| 776 | 0 | 8 | |i Print version: |a Marín, C. (Carlos), 1970- |t Orientation of single crystals by back-reflection Laue pattern simulation. |d Singapore ; River Edge, N.J. : World Scientific, ©1999 |z 9810228716 |w (DLC) 98054444 |w (OCoLC)40545400 |
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