Cargando…
X-ray scattering from semiconductors /
X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have bee...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
London :
Imperial College Press,
2000.
|
| Temas: | |
| Acceso en línea: | Texto completo |
Tabla de Contenidos:
- Ch. 1. An introduction to semiconductor materials
- ch. 2. An introduction to X-ray scattering
- ch. 3. Equipment for measuring diffraction patterns
- ch. 4. A practical guide to the evaluation of structural parameters.