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Advanced measurement and test : selected, peer reviewed papers from the 2011 International Conference on Advanced Measurement and Test (AMT 2011), June 24-26, 2011, Nanchang, China /
This second collection on ""Advanced Measurement and Test II"" is dedicated to the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, sys...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor Corporativo: | |
| Otros Autores: | , |
| Formato: | Electrónico Congresos, conferencias eBook |
| Idioma: | Inglés |
| Publicado: |
Durnten-Zurich, Switzerland ; Enfield, NH :
Trans Tech Publication,
©2011.
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| Colección: | Advanced materials research ;
v. 301-303. |
| Temas: | |
| Acceso en línea: | Texto completo |