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Advanced mathematical and computational tools in metrology and testing IX /

This volume contains original, refereed worldwide contributions. They were prompted by presentations made at the ninth AMCTM Conference held in Goteborg (Sweden) in June 2011 on the theme of advanced mathematical and computational tools in metrology and also, in the title of this book series, in tes...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Pavese, Franco
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Singapore : World Scientific, 2012.
Colección:Series on advances in mathematics for applied sciences ; v. 84.
Temas:
Acceso en línea:Texto completo

MARC

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245 0 0 |a Advanced mathematical and computational tools in metrology and testing IX /  |c editors, F. Pavese [and others]. 
246 3 |a AMCTM IX 
260 |a Singapore :  |b World Scientific,  |c 2012. 
300 |a 1 online resource (xii, 450 pages) :  |b illustrations 
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490 1 |a Series on advances in mathematics for applied sciences ;  |v v. 84 
504 |a Includes bibliographical references and index. 
505 0 |a Recommended tools for sensitivity analysis associated to the evaluation of measurement uncertainty / A. Allard and N. Fischer -- A simple confidence interval for the common mean / B. Arendacka -- Estimation of detailed deviation zone of inspected surfaces / A. Barari -- Case study of likelihood and Bayes approaches for measurement based on nonlinear regression / A. Bariska and R. Burgin -- Mathematical and computational aspects of treatment ordinal measurement results / E. Bashkansky and T. Gadrich -- Calibration of ordinal metrical scale / E. Benoit -- Comparison of different choices for a prior under partial information in a Bayesian analysis / O. Bodnar, G. Wubbeler and C. Elster -- Self-consistent reference value estimation / W. Bremser -- Uncertainty modeling in 3D SEM stereophotogrammetry / L. Carli, M. Galetto and G. Genta -- Using statistical confidence boundary of a D.O.E. response surface to estimate optimal factors / J. Chaves-Jacob, J.M. Linares and J.M. Sprauel -- Software to support the use of GUM Supplement 2 -- extension to any number of output quantities / M.G. Cox, P.M. Harris and I.M. Smith -- Probabilistic characterization of face measurement / F. Crenna, G.B. Rossi and L. Bovio -- Prediction of resistance standards time behavior by stochastic determination of Lagrange polynomial / M. Cundeva-Blajer, L. Arsov and R. Malaric -- Modelling expert knowledge to assign consensus values in proficiency tests / S. Demeyer and N. Fischer -- Some mitigations for unequal data variance in linear regression / P. Dupuis [and others] -- Uncertainty evaluation for continuous-time measurements / S. Eichstadt and C. Elster -- Measurement of accessibility to rail transport systems / R. Emardson [and others] -- Uncertainty evaluation for traceable dynamic measurement of mechanical quantities: a case study in dynamic pressure calibration / T. Esward [and others] -- Uncertainty calculation of a multicamera tracking system in a cave / F. Ezedine, W.M. Wan Muhamad and J.M. Linares -- A two-stage MCM/MCMC algorithm for uncertainty evaluation / A.B. Forbes -- Mathematical models for error correction in MScMS-II (Mobile Spatial Coordinate Measurement System) / M. Galetto and L. Mastrogiacomo -- Data fusion techniques for cylindrical surface measurements / M. Galovska, R. Tutsch and O. Jusko -- Nodal load observer with imperfect measurement infrastructure for (SMART) electrical grids / G. Gewiss, H.-P. Beck and J. zum Hingst -- Metrological traceability and quality of industrial tests measurements / V.A. Granovsky and T.N. Siraya -- Stochastic modeling aspects for an improved solution of the inverse problem in scatterometry / H. Gross [and others] -- Influence of the look-up window size when applying a statistical feed-forward controller / C. Hernandez and R. Tutsch -- Only non-informative Bayesian prior distributions agree with the GUM Type A: evaluations of input quantities / R. Kacker, R. Kessel and K.-D. Sommer -- Bayesian variance separation under heteroscedasticity: application to an unstable measurand / K. Klauenberg, K. Jousten and C. Elster -- Bayesian inference in waveform metrology / G.A. Kyriazis. 
505 8 |a Coordinate generator for TKA navigator testing after reference frame displacement / J. Mailhe, J.M. Linares and J.M. Sprauel -- Multi soft-sensors data fusion in spatial forecasting of environmental parameters / U. Maniscalco and G. Pilato -- Metrology and design with continuous models: tools for optimisation, sensitivity, and uncertainty evaluation / C.E. Matthews, L. Wright and X.-S. Yang -- Numerical simulations and turbulent modelling for application in flow metrology / R. Model [and others] -- A method of weighing matrix for spectrophotometric analysis of oil mixtures / R.Z. Morawski, A. Miekina and J. Wagner -- Differences in recordings of collocated identical sensors / F. Moschas and S. Stiros -- The use of cryptographic principles within metrology software / S. Parkinson [and others] -- On the difference of meanings of "zero correction": zero value versus no correction, and of the associated uncertainties / F. Pavese -- Need for consistency of terminology in international standards and guidelines. A case study: trueness / F. Pavese -- Uncertainty & risks in decision-making in qualitative measurement: an information-theoretical approach / L.R. Pendrill -- Rate-of-change analysis applied to machine tool monitoring and maintenance schedules / Ch. Perkins [and others] -- Application of spline surface profile filters to subpixel contour decomposition problems / E. Reetz [and others] -- Resolving power and superresolution for spectrometers used in radiation detection / M. Reginatto -- Measurement and evaluation of asynchronous radial error of a high speed spindle / G.L. Samuel and S.D. Ashok -- Measuring edges on pivot-mounted objects during rotation / M. Schumann [and others] -- Theory of AND computation program for determination of the reference value in key comparisons based on Bayesian statistics / K. Shirono, H. Tanaka and K. Ehara -- Modelling and uncertainty evaluation for the radiation quality parameters used in metrological management of diagnostic radiology dosimeters / A. Silva Ribeiro [and others] -- Vibration damping using laser vibrometry investigated with the Anova Method / D. Sporea and F.-D. Frumosu -- Testing autosar basic software modules with Quickcheck / R. Svenningsson [and others] -- Mathematical method for the definition of a non linear multi input-one output calibration diagram for a laser position sensor / D. Vetturi [and others] -- Form tolerance verification: a sequential approach of the inspected design / G. Vicario [and others] -- Application of the uncertainty theory in the leak testing of the spacecraft / Y. Wang, R.X. Yan and L.C. Sun -- Evaluation and numerical presentation of the results of indirect multivariate measurements / Z.L. Warsza -- Measurement uncertainty and procedures of conformity assessment / R. Willink -- Assessment of the GUM S1 adaptive Monte Carlo scheme / G. Wubbeler [and others] -- Visualization-assisted analytical method for evaluating propagation of uncertainty / X. Bian [and others]. 
520 |a This volume contains original, refereed worldwide contributions. They were prompted by presentations made at the ninth AMCTM Conference held in Goteborg (Sweden) in June 2011 on the theme of advanced mathematical and computational tools in metrology and also, in the title of this book series, in testing. The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also in keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards. 
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650 0 |a Physical measurements  |v Congresses. 
650 0 |a Metrology  |v Congresses. 
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650 6 |a Mesures physiques  |v Congrès. 
650 6 |a Métrologie  |v Congrès. 
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700 1 |a Pavese, Franco. 
776 0 8 |i Print version:  |t Advanced mathematical and computational tools in metrology and testing IX.  |d Singapore : World Scientific, 2012  |w (DLC) 2009001775 
830 0 |a Series on advances in mathematics for applied sciences ;  |v v. 84. 
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