Cargando…
Handbook of instrumentation and techniques for semiconductor nanostructure characterization /
"As we delve more deeply into the physics and chemistry of functional materials and processes, we are inexorably driven to the nanoscale. And nowhere is the development of instrumentation and associated techniques more important to scientific progress than in the area of nanoscience. The dramat...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | , , , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Colección: | World Scientific series in materials and energy ;
v. 1-2. |
| Temas: | |
| Acceso en línea: | Texto completo |
Tabla de Contenidos:
- Volume 1: Electron Microscopies. Characterization of Semiconductor Nanostructures by Scanning Electron Microscopy / Lynne M. Gignac and Oliver C. Wells
- Transmission Electron Microscopy and Ultra-high Vacuum Transmission Electron Microscopy of Semiconductor Nanostructures / Suneel Kodambaka and Frances M. Ross
- Aberration Corrected Electron Microscopy / Philip E. Batson
- Low-Energy Electron Microscopy for Nanoscale Characterization / James B. Hannon and Rudolf M. Tromp
- Ultrafast Microscopy of Plasmon Dynamics in Nanostructured Metal Surfaces / Hrvoje Petek and Atsushi Kubo
- X-Ray Diffraction Methods for Studying Strain and Composition in Epitaxial Nanostructured Systems / Angelo Malachias [and 5 others]
- Stress Determination in Semiconductor Nanostructures Using X-Ray Diffraction / Conal E. Murry and I. Cevdet Noyan.
- Volume 2: Scanning Probes. An Introduction to Scanning Probe Microscopy of Semiconductors with Case Studies Concerning Gallium Nitride and Related Materials / Rachel Oliver
- STM of Self Assembled III-V Nanostructures / Vaishno D. Dasika and Rachel S. Goldman
- Atom and Optical Probes. Atom Probe Tomography for Microelectronics / David J. Larson [and 5 others]
- Raman Spectroscopy of Carbon Nanotubes and Graphene Materials and Devices / Marcus Freitag and James C. Tsang
- Single Nanowire Photoelectron Spectroscopy / Carlos Aguilar and Richard Haight
- Time-Domain Thermoreflectance Measurements for Thermal Property Characterization of Nanostructures / Scott T. Huxtable.