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Advanced mathematical & computational tools in metrology V /
Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality, as well as on better use of advanced mathematical tools and development of new ones. In this volume, scientists from both the mathematical and the metrological fields exchange their exp...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Singapore ; River Edge, N.J. :
World Scientific,
©2001.
|
| Colección: | Series on advances in mathematics for applied sciences ;
v. 57. |
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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| 245 | 0 | 0 | |a Advanced mathematical & computational tools in metrology V / |c editors P. Ciarlini [and others]. |
| 246 | 3 | 0 | |a Advanced mathematical and computational tools in metrology V |
| 260 | |a Singapore ; |a River Edge, N.J. : |b World Scientific, |c ©2001. | ||
| 300 | |a 1 online resource. | ||
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| 490 | 1 | |a Series on advances in mathematics for applied sciences ; |v v. 57 | |
| 500 | |a Collection of the revised contributions at the fifth workshop on the theme of advanced mathematical and computational tools in metrology held in Caparica, Portugal, in May 2000. | ||
| 504 | |a Includes bibliographical references and index. | ||
| 505 | 0 | 0 | |t Discrete B-Spline Approximation in a Variety of Norms / |r I.J. Anderson and D.A. Turner -- |t Local and Global Calibration of Coordinate Measuring Machines / |r S.D. Antunes, P.M.V.C.D. Antunes and M.A.F. Vicente -- |t Parameter Intrinsic Identifiability of Error Models: The Case of Geometrical Errors of CMMs / |r A. Balsamo -- |t A Methodology for Testing the Numerical Accuracy of Scientific Software Used in Metrology / |r J. Barrett, M.G. Cox and M.P. Dainton / |r [and others] -- |t A Statistical Model for the Analysis of Single-Photon Counts / |r S. Castelletto, I.P. Degiovanni and M.L. Rastello -- |t ActiveX-Tools for Data Acquisition with Automatic ASL-F18 and MI-6010 Bridges / |r B. Cavigioli, P. Marcarino and A. Merlone / |r [and others]. |
| 520 | |a Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality, as well as on better use of advanced mathematical tools and development of new ones. In this volume, scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors, such as instrumentation and software, will benefit from this exchange, since metrology has a high impact on the overall quality of industrial products, and applied mathematics is becoming more and more important in industrial processes. This book is of interest to people. | ||
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