Microelectronics failure analysis : desk reference /

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores Corporativos: ASM International, Electronic Device Failure Analysis Society
Otros Autores: Ross, Richard J.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Materials Park, Ohio : ASM International, ©2011.
Edición:6th ed.
Temas:
Microelectronics > Materials > Testing > Handbooks, manuals, etc.
Microelectronics > Defects > Testing > Handbooks, manuals, etc.
Electronic apparatus and appliances > Testing > Handbooks, manuals, etc.
Electronics > Materials > Testing > Handbooks, manuals, etc.
Electronics > Materials > Defects > Handbooks, manuals, etc.
Electronics > Materials > Handbooks, manuals, etc.
Appareils électroniques > Essais > Guides, manuels, etc.
Électronique > Matériaux > Guides, manuels, etc.
TECHNOLOGY & ENGINEERING > Electronics > Digital.
TECHNOLOGY & ENGINEERING > Electronics > Microelectronics.
Electronic apparatus and appliances > Testing
Electronics > Materials > Defects
Electronics > Materials > Testing
Microelectronics > Materials > Testing
Handbook
handbooks.
Handbooks and manuals
Handbooks and manuals.
Guides et manuels.
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Section 1. Introduction
  • section 2. Failure analysis process overviews
  • section 3. Failure analysis topics
  • section 4. Fault verification and classification
  • section 5. Localization techniques
  • section 6. Deprocessing and sample preparation
  • section 7. Inspection
  • section 8. Materials analysis
  • section 9. Focused ion beam applications
  • section 10. Management and reference information.

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