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Characterization in compound semiconductor processing /

This volume has been written to aid scientists and engineers working with compound semiconductor materials and devices in the selection and application of various analytical techniques. It highlights analytical problems that occur at all stages of materials or device processing (substrate preparatio...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Strausser, Yale, McGuire, G. E.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York : Momentum Press, 1995.
Colección:Materials characterization series.
Temas:
Acceso en línea:Texto completo