|
|
|
|
LEADER |
00000cam a2200000Ma 4500 |
001 |
EBSCO_ocn747539683 |
003 |
OCoLC |
005 |
20231017213018.0 |
006 |
m o d |
007 |
cr cuu|||uu||| |
008 |
090522s2008 si a ob 001 0 eng d |
040 |
|
|
|a World Scientific Publishing
|b eng
|e pn
|c STF
|d N$T
|d OCLCF
|d YDXCP
|d DEBSZ
|d OCLCQ
|d AGLDB
|d ZCU
|d MERUC
|d U3W
|d OCLCQ
|d VTS
|d ICG
|d INT
|d AU@
|d OCLCQ
|d JBG
|d OCLCQ
|d DKC
|d OCLCQ
|d M8D
|d LEAUB
|d OCLCO
|d OCLCQ
|
016 |
7 |
|
|a 000043547296
|2 AU
|
019 |
|
|
|a 1058088804
|a 1086567606
|
020 |
|
|
|a 9789812797346
|q (electronic bk.)
|
020 |
|
|
|a 9812797343
|q (electronic bk.)
|
020 |
|
|
|a 9789812797339
|
020 |
|
|
|a 9812797335
|
029 |
1 |
|
|a AU@
|b 000049007394
|
029 |
1 |
|
|a DEBBG
|b BV043070069
|
029 |
1 |
|
|a DEBBG
|b BV044175677
|
029 |
1 |
|
|a DEBSZ
|b 421284951
|
029 |
1 |
|
|a DEBSZ
|b 431423857
|
029 |
1 |
|
|a GBVCP
|b 803625626
|
035 |
|
|
|a (OCoLC)747539683
|z (OCoLC)1058088804
|z (OCoLC)1086567606
|
037 |
|
|
|b Knovel Corporation
|n http://www.knovel.com
|
050 |
|
4 |
|a QH212.E4
|
072 |
|
7 |
|a SCI
|x 023000
|2 bisacsh
|
082 |
0 |
4 |
|a 502.825
|2 22
|
049 |
|
|
|a UAMI
|
245 |
0 |
0 |
|a In-situ electron microscopy at high resolution /
|c editor, Florian Banhart.
|
260 |
|
|
|a Singapore ;
|a Hackensack, N.J. :
|b World Scientific Pub. Co.,
|c ©2008.
|
300 |
|
|
|a 1 online resource (vi, 311 pages) :
|b illustrations (some color)
|
336 |
|
|
|a text
|b txt
|2 rdacontent
|
337 |
|
|
|a computer
|b c
|2 rdamedia
|
338 |
|
|
|a online resource
|b cr
|2 rdacarrier
|
504 |
|
|
|a Includes bibliographical references and index.
|
505 |
0 |
|
|a Ch. 1. Introduction to in-situ electron microscopy / Florian Banhart -- ch. 2. Observation of dynamic processes using environmental transmission or scanning transmission electron microscopy / Renu Sharma -- ch. 3. In-situ high-resolution observation of solid-solid, solid-liquid and solid-gas reactions / Hiroyasu Saka -- ch. 4. In-situ transmission electron microscopy: nanoindentation and straining experiments / Wouter A. Soer and Jeff T. De Hosson -- ch. 5. In-situ HRTEM studies of interface dynamics during solid-solid phase transformations in metal alloys / James M. Howe -- ch. 6. In-situ TEM of filled nanotubes: heating, electron irradiation, electrical and mechanical probing / Dmitri Golberg and Yoshio Bando -- ch. 7. In-situ ion and electron beam effects on the fabrication and analysis of nanomaterials / Kazuo Furuya, Minghui Song, and Masayuki Shimojo -- ch. 8. Electron irradiation of nanomaterials in the electron microscope / Florian Banhart -- ch. 9. In-situ observation of atomic defects in carbon nanostructures / Kazu Suenaga.
|
520 |
|
|
|a In-situ high-resolution electron microscopy is a modern and powerful technique in materials research, physics, and chemistry. In-situ techniques are hardly treated in textbooks of electron microscopy. Thus, there is a need to collect the present knowledge about the techniques and achievements of in-situ electron microscopy in one book. Since high-resolution electron microscopes are available in most modern laboratories of materials science, more and more scientists or students are starting to work on this subject. In this comprehensive volume, the most important techniques and achievements of in-situ high-resolution electron microscopy will be reviewed by renowned experts. Applications in several fields of materials science will also be demonstrated.
|
590 |
|
|
|a eBooks on EBSCOhost
|b EBSCO eBook Subscription Academic Collection - Worldwide
|
650 |
|
0 |
|a Electron microscopy
|x Technique.
|
650 |
|
0 |
|a High resolution electron microscopy.
|
650 |
|
6 |
|a Microscopie électronique
|x Technique.
|
650 |
|
6 |
|a Microscopie électronique à haute résolution.
|
650 |
|
7 |
|a SCIENCE
|x Electron Microscopes & Microscopy.
|2 bisacsh
|
650 |
|
7 |
|a Electron microscopy
|x Technique.
|2 fast
|0 (OCoLC)fst00906689
|
650 |
|
7 |
|a High resolution electron microscopy.
|2 fast
|0 (OCoLC)fst00956062
|
700 |
1 |
|
|a Banhart, Florian.
|
710 |
2 |
|
|a World Scientific (Firm)
|
776 |
0 |
8 |
|i Print version:
|t In-situ electron microscopy at high resolution.
|d Hackensack, NJ : World Scientific, ©2008
|z 9789812797339
|
856 |
4 |
0 |
|u https://ebsco.uam.elogim.com/login.aspx?direct=true&scope=site&db=nlebk&AN=521202
|z Texto completo
|
938 |
|
|
|a EBSCOhost
|b EBSC
|n 521202
|
938 |
|
|
|a YBP Library Services
|b YANK
|n 9975170
|
994 |
|
|
|a 92
|b IZTAP
|