Electromigration in ULSI interconnections /
Electromigration in ULSI Interconnections provides a comprehensive description of the electromigration in integrated circuits. It is intended for both beginner and advanced readers on electromigration in ULSI interconnections. It begins with the basic knowledge required for a detailed study on elect...
Clasificación: | Libro Electrónico |
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Autor principal: | Tan, Cher Ming, 1959- |
Autor Corporativo: | World Scientific (Firm) |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
Singapore ; Hackensack, N.J. :
World Scientific Pub. Co.,
©2010.
|
Colección: | International series on advances in solid state electronics and technology.
|
Temas: | |
Acceso en línea: | Texto completo |
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