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Reliability and radiation effects in compound semiconductors /

This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. It starts with first principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms. It is the first...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Johnston, Allan (Allan H.)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Singapore ; Hackensack, NJ : World Scientific, ©2010.
Temas:
Acceso en línea:Texto completo
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por Johnston, Allan (Allan H.)
Publicado 2010
Texto completo
Electrónico eBook
Search Result 2
por Johnston, Allan (Allan H.)
Publicado 2010
Texto completo
Electrónico eBook