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|a UAMI
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|a Chen, C. Julian.
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1 |
0 |
|a Introduction to scanning tunneling microscopy /
|c C. Julian Chen.
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| 260 |
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|a New York :
|b Oxford University Press,
|c 1993.
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|
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|a 1 online resource (xxii, 412 pages, 31 pages of plates) :
|b illustrations
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|a data file
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1 |
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|a Oxford series in optical and imaging sciences ;
|v 4
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| 504 |
|
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|a Includes bibliographical references (pages 383-404) and index.
|
| 505 |
2 |
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|a 1. Overview. 1.1. The scanning tunneling microscope in a nutshell. 1.2. Tunneling: an elementary model. 1.3. Probing electronic structure at an atomic scale. 1.4. Spatially resolved tunneling spectroscopy. 1.5. Lateral resolution: Early theories. 1.6. Origin of atomic resolution in STM. 1.7. Tip-sample interaction effects. 1.8. Historical remarks -- 2. Atom-scale tunneling. 2.2. The perturbation approach. 2.3. The image force. 2.4. The Square-barrier problem. 2.5. The modified Bardeen approach. 2.6. Effect of image force on tunneling -- 3. Tunneling matrix elements. 3.2. Tip wavefunctions. 3.3. Green's function and tip wavefunctions. 3.4. The derivative rule: individual cases. 3.5. The derivative rule: general case. 3.6. An intuitive interpretation -- 4. Wavefunctions at surfaces. 4.1. Types of surface wavefunctions. 4.2. The jellium model. 4.3. Concept of surface states. 4.4. Field emission spectroscopy. 4.5. Photoemission studies. 4.6. Atom-beam diffraction.
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|a eBooks on EBSCOhost
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|a Scanning tunneling microscopy.
|
| 650 |
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2 |
|a Microscopy, Scanning Tunneling
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| 650 |
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6 |
|a Microscopie à effet tunnel.
|
| 650 |
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|x Microscopes & Microscopy.
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|a Scanning tunneling microscopy
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|a Rastertunnelmikroskopie
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| 650 |
1 |
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|a Scanning tunneling microscopy.
|2 gtt
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| 650 |
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|a Microscopie tunnel à balayage.
|2 ram
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| 653 |
0 |
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|a Microscopy
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| 776 |
0 |
8 |
|i Print version:
|a Chen, C. Julian.
|t Introduction to scanning tunneling microscopy.
|d New York : Oxford University Press, 1993
|z 9780195071504
|w (DLC) 92040047
|w (OCoLC)27035849
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|a Oxford series in optical and imaging sciences ;
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