ISTFA 2001 : proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores Corporativos: International Symposium for Testing and Failure Analysis Santa Clara, Calif., ASM International, Electronic Device Failure Analysis Society
Formato: Electrónico Congresos, conferencias eBook
Idioma:Inglés
Publicado: Materials Park, OH : ASM International, ©2001.
Temas:
Electronics > Materials > Testing > Congresses.
Electronic apparatus and appliances > Testing > Congresses.
Appareils électroniques > Essais > Congrès.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > General.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > Integrated.
Electronic apparatus and appliances > Testing.
Electronics > Materials > Testing.
Conference papers and proceedings.
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Preface
  • Table of Contents
  • IPFA 2000 Best Paper Award Winner
  • Session 1: Advanced Techniques 1
  • Session 2: Advanced Techniques 2
  • Session 3: Packaging
  • Session 4: Poster Session
  • Session 5: Backside 1
  • Session 6: SPM
  • Session 7: Backside 2
  • Session 8: Case Histories 1
  • Session 9: FIB
  • Session 10: Case Histories 2
  • Session 11: MEMS
  • Session 12: Techniques
  • Session 13: Yield Improvement
  • Session 14: Discretes
  • Session 15: Defect-Based Testing
  • Index

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