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|a International Symposium for Testing and Failure Analysis
|n (27th :
|d 2001 :
|c Santa Clara, Calif.)
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|a ISTFA 2001 :
|b proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /
|c sponsored by EDFAS.
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|a Proceedings of the 27th International Symposium or Testing and Failure Analysis
|
| 246 |
3 |
0 |
|a Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis
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|a Materials Park, OH :
|b ASM International,
|c ©2001.
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|a 1 online resource (xix, 485 pages) :
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|a Includes bibliographical references and index.
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|a Preface -- Table of Contents -- IPFA 2000 Best Paper Award Winner -- Session 1: Advanced Techniques 1 -- Session 2: Advanced Techniques 2 -- Session 3: Packaging -- Session 4: Poster Session -- Session 5: Backside 1 -- Session 6: SPM -- Session 7: Backside 2 -- Session 8: Case Histories 1 -- Session 9: FIB -- Session 10: Case Histories 2 -- Session 11: MEMS -- Session 12: Techniques -- Session 13: Yield Improvement -- Session 14: Discretes -- Session 15: Defect-Based Testing -- Index
|
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|a Electronics
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|v Congresses.
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| 650 |
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0 |
|a Electronic apparatus and appliances
|x Testing
|v Congresses.
|
| 650 |
|
6 |
|a Appareils électroniques
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| 650 |
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|a TECHNOLOGY & ENGINEERING
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|x Circuits
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|a TECHNOLOGY & ENGINEERING
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|x Circuits
|x Integrated.
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|a Electronics
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|0 (OCoLC)fst00907571
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|a Conference papers and proceedings.
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|a ASM International.
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|a Electronic Device Failure Analysis Society.
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|i Print version:
|a International Symposium for Testing and Failure Analysis (27th : 2001 : Santa Clara, Calif.).
|t ISTFA 2001.
|d Materials Park, Ohio : ASM International, ©2001
|z 0871707462
|w (OCoLC)48999062
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