Microelectronic failure analysis : desk reference : 2001 supplement /

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: Electronic Device Failure Analysis Society
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Materials Park, OH : ASM International, ©2001.
Temas:
Electronics > Materials > Testing > Handbooks, manuals, etc.
Microelectronics > Materials > Testing > Handbooks, manuals, etc.
Microelectronics > Materials > Defects > Handbooks, manuals, etc.
Electronic apparatus and appliances > Testing > Handbooks, manuals, etc.
Semiconductors > Defects > Handbooks, manuals, etc.
Microelectronics > Defects > Handbooks, manuals, etc.
Microélectronique > Défauts > Guides, manuels, etc.
Appareils électroniques > Essais > Guides, manuels, etc.
Semi-conducteurs > Défauts > Guides, manuels, etc.
TECHNOLOGY & ENGINEERING > Electronics > Digital.
TECHNOLOGY & ENGINEERING > Electronics > Microelectronics.
Electronic apparatus and appliances > Testing
Electronics > Materials > Testing
Microelectronics > Materials > Defects
Microelectronics > Materials > Testing
Semiconductors > Defects
Handbooks and manuals
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Preface
  • Contents
  • Focused Ion Beam Backside Isolation Techniques
  • Package/Sample Cross Sectioning
  • Copper Deprocessing
  • Atomic Force Microscopy, Scanning Probe Microscopy, and Scanning Capacitance Microscopy
  • Supplementary Information

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