|
|
|
|
| LEADER |
00000cam a2200000Ia 4500 |
| 001 |
EBSCO_ocn647829197 |
| 003 |
OCoLC |
| 005 |
20231017213018.0 |
| 006 |
m o d |
| 007 |
cr cn||||||||| |
| 008 |
020606s2001 ohua obf 001 0 eng d |
| 040 |
|
|
|a E7B
|b eng
|e pn
|c E7B
|d OCLCQ
|d OCLCE
|d OCLCQ
|d B24X7
|d GZM
|d N$T
|d OCLCQ
|d OCLCF
|d YDXCP
|d D6H
|d OCL
|d EBLCP
|d OCLCQ
|d AGLDB
|d MOR
|d PIFAG
|d ZCU
|d MERUC
|d OCLCQ
|d U3W
|d STF
|d WRM
|d OCLCQ
|d VTS
|d OCLCQ
|d NRAMU
|d ICG
|d INT
|d JBG
|d VT2
|d AU@
|d OCLCQ
|d WYU
|d OCLCQ
|d DKC
|d OCLCQ
|d UKCRE
|d AJS
|d HS0
|d OCLCQ
|d OCLCO
|d M8D
|d OCLCO
|d OCLCQ
|d OCLCO
|
| 019 |
|
|
|a 606899840
|a 646719893
|a 764524340
|a 764561807
|a 961570637
|a 962630420
|a 975207276
|a 975245639
|a 988519401
|a 992061250
|a 999637288
|a 1002373027
|a 1018083018
|a 1037919719
|a 1038047440
|a 1038648591
|a 1041674505
|a 1045500424
|a 1047954783
|a 1053536661
|a 1055328503
|a 1058081987
|a 1064636988
|a 1081230208
|a 1153524595
|
| 020 |
|
|
|a 9781615032655
|q (electronic bk.)
|
| 020 |
|
|
|a 1615032657
|q (electronic bk.)
|
| 020 |
|
|
|z 9780871707451
|
| 020 |
|
|
|z 0871707454
|q (pbk.)
|
| 029 |
1 |
|
|a AU@
|b 000051395097
|
| 029 |
1 |
|
|a AU@
|b 000062642929
|
| 029 |
1 |
|
|a DEBBG
|b BV043163231
|
| 029 |
1 |
|
|a DEBBG
|b BV044182314
|
| 029 |
1 |
|
|a DEBSZ
|b 421522887
|
| 029 |
1 |
|
|a NZ1
|b 13860870
|
| 035 |
|
|
|a (OCoLC)647829197
|z (OCoLC)606899840
|z (OCoLC)646719893
|z (OCoLC)764524340
|z (OCoLC)764561807
|z (OCoLC)961570637
|z (OCoLC)962630420
|z (OCoLC)975207276
|z (OCoLC)975245639
|z (OCoLC)988519401
|z (OCoLC)992061250
|z (OCoLC)999637288
|z (OCoLC)1002373027
|z (OCoLC)1018083018
|z (OCoLC)1037919719
|z (OCoLC)1038047440
|z (OCoLC)1038648591
|z (OCoLC)1041674505
|z (OCoLC)1045500424
|z (OCoLC)1047954783
|z (OCoLC)1053536661
|z (OCoLC)1055328503
|z (OCoLC)1058081987
|z (OCoLC)1064636988
|z (OCoLC)1081230208
|z (OCoLC)1153524595
|
| 042 |
|
|
|a dlr
|
| 050 |
|
4 |
|a TK7871
|b .M53 2001eb
|
| 072 |
|
7 |
|a TEC
|x 008060
|2 bisacsh
|
| 072 |
|
7 |
|a TEC
|x 008070
|2 bisacsh
|
| 082 |
0 |
4 |
|a 621.381
|2 22
|
| 049 |
|
|
|a UAMI
|
| 245 |
0 |
0 |
|a Microelectronic failure analysis :
|b desk reference : 2001 supplement /
|c prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee.
|
| 260 |
|
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|a Materials Park, OH :
|b ASM International,
|c ©2001.
|
| 300 |
|
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|a 1 online resource (v, 171 pages) :
|b illustrations
|
| 336 |
|
|
|a text
|b txt
|2 rdacontent
|
| 337 |
|
|
|a computer
|b c
|2 rdamedia
|
| 338 |
|
|
|a online resource
|b cr
|2 rdacarrier
|
| 504 |
|
|
|a Includes bibliographical references and index.
|
| 588 |
0 |
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|a Print version record.
|
| 506 |
|
|
|3 Use copy
|f Restrictions unspecified
|2 star
|5 MiAaHDL
|
| 533 |
|
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|a Electronic reproduction.
|b [Place of publication not identified] :
|c HathiTrust Digital Library,
|d 2010.
|5 MiAaHDL
|
| 538 |
|
|
|a Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
|u http://purl.oclc.org/DLF/benchrepro0212
|5 MiAaHDL
|
| 583 |
1 |
|
|a digitized
|c 2010
|h HathiTrust Digital Library
|l committed to preserve
|2 pda
|5 MiAaHDL
|
| 505 |
0 |
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|a Preface -- Contents -- Focused Ion Beam Backside Isolation Techniques -- Package/Sample Cross Sectioning -- Copper Deprocessing -- Atomic Force Microscopy, Scanning Probe Microscopy, and Scanning Capacitance Microscopy -- Supplementary Information
|
| 590 |
|
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|a eBooks on EBSCOhost
|b EBSCO eBook Subscription Academic Collection - Worldwide
|
| 650 |
|
0 |
|a Electronics
|x Materials
|x Testing
|v Handbooks, manuals, etc.
|
| 650 |
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0 |
|a Microelectronics
|x Materials
|x Testing
|v Handbooks, manuals, etc.
|
| 650 |
|
0 |
|a Microelectronics
|x Materials
|x Defects
|v Handbooks, manuals, etc.
|
| 650 |
|
0 |
|a Electronic apparatus and appliances
|x Testing
|v Handbooks, manuals, etc.
|
| 650 |
|
0 |
|a Semiconductors
|x Defects
|v Handbooks, manuals, etc.
|
| 650 |
|
0 |
|a Microelectronics
|x Defects
|v Handbooks, manuals, etc.
|
| 650 |
|
6 |
|a Microélectronique
|x Défauts
|v Guides, manuels, etc.
|
| 650 |
|
6 |
|a Appareils électroniques
|x Essais
|v Guides, manuels, etc.
|
| 650 |
|
6 |
|a Semi-conducteurs
|x Défauts
|v Guides, manuels, etc.
|
| 650 |
|
7 |
|a TECHNOLOGY & ENGINEERING
|x Electronics
|x Digital.
|2 bisacsh
|
| 650 |
|
7 |
|a TECHNOLOGY & ENGINEERING
|x Electronics
|x Microelectronics.
|2 bisacsh
|
| 650 |
|
7 |
|a Electronic apparatus and appliances
|x Testing
|2 fast
|
| 650 |
|
7 |
|a Electronics
|x Materials
|x Testing
|2 fast
|
| 650 |
|
7 |
|a Microelectronics
|x Materials
|x Defects
|2 fast
|
| 650 |
|
7 |
|a Microelectronics
|x Materials
|x Testing
|2 fast
|
| 650 |
|
7 |
|a Semiconductors
|x Defects
|2 fast
|
| 655 |
|
7 |
|a Handbooks and manuals
|2 fast
|
| 710 |
2 |
|
|a Electronic Device Failure Analysis Society.
|
| 776 |
0 |
8 |
|i Print version:
|t Microelectronic failure analysis.
|d Materials Park, OH : ASM International, ©2001
|w (OCoLC)49935399
|
| 856 |
4 |
0 |
|u https://ebsco.uam.elogim.com/login.aspx?direct=true&scope=site&db=nlebk&AN=395849
|z Texto completo
|
| 938 |
|
|
|a Books 24x7
|b B247
|n bke00042662
|
| 938 |
|
|
|a ebrary
|b EBRY
|n ebr10320372
|
| 938 |
|
|
|a EBSCOhost
|b EBSC
|n 395849
|
| 938 |
|
|
|a YBP Library Services
|b YANK
|n 3623613
|
| 994 |
|
|
|a 92
|b IZTAP
|
