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EBSCO_ocn647828198 |
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071127s2007 ohua ob 101 0 eng d |
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|a UAMI
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| 111 |
2 |
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|a International Symposium for Testing and Failure Analysis
|n (33rd :
|d 2007 :
|c San Jose, Calif.)
|
| 245 |
1 |
0 |
|a ISTFA 2007 :
|b proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /
|c sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International.
|
| 246 |
3 |
0 |
|a Proceedings of the 33rd International Symposium for Testing and Failure Analysis
|
| 246 |
3 |
0 |
|a 33rd International Symposium for Testing and Failure Analysis
|
| 246 |
3 |
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|a Thirty-third International Symposium for Testing and Failure Analysis
|
| 260 |
|
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|a Materials Park, OH :
|b ASM International,
|c ©2007.
|
| 300 |
|
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|a 1 online resource (xvi, 356 pages) :
|b illustrations
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| 336 |
|
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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|a online resource
|b cr
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| 504 |
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|a Includes bibliographical references and index.
|
| 588 |
0 |
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|a Print version record.
|
| 505 |
0 |
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|a Contents -- Session 1: Emerging Concepts -- Session 2: Circuit Edit 1 -- Session 3: SPM Techniques -- Session 4: Sample Preparation -- Session 5: Photon Based Techniques -- Session 6: In-Line Metrology and Inspection -- Session 7: Package and Assembly Level FA 1 -- Session 8: Posters -- Session 9: Package and Assembly Level FA 2 -- Session 10: Nanoprobing -- Session 11: Package and Assembly Level FA 3 -- Session 12: Failure Analysis Process 1 -- Session 13: Yield Enhancement -- Session 14: System Level Analysis and Test -- Session 15: Circuit Edit 2
|
| 590 |
|
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|a eBooks on EBSCOhost
|b EBSCO eBook Subscription Academic Collection - Worldwide
|
| 650 |
|
0 |
|a Electronics
|x Materials
|x Testing
|v Congresses.
|
| 650 |
|
0 |
|a Electronic apparatus and appliances
|x Testing
|v Congresses.
|
| 650 |
|
6 |
|a Appareils électroniques
|x Essais
|v Congrès.
|
| 650 |
|
7 |
|a TECHNOLOGY & ENGINEERING
|x Electronics
|x Circuits
|x General.
|2 bisacsh
|
| 650 |
|
7 |
|a TECHNOLOGY & ENGINEERING
|x Electronics
|x Circuits
|x Integrated.
|2 bisacsh
|
| 650 |
|
7 |
|a Electronic apparatus and appliances
|x Testing.
|2 fast
|0 (OCoLC)fst00906837
|
| 650 |
|
7 |
|a Electronics
|x Materials
|x Testing.
|2 fast
|0 (OCoLC)fst00907571
|
| 655 |
|
7 |
|a Conference papers and proceedings.
|2 fast
|0 (OCoLC)fst01423772
|
| 710 |
2 |
|
|a ASM International.
|
| 710 |
2 |
|
|a Electronic Device Failure Analysis Society.
|
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|z 0871708639
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|z 9780871708632
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