ISTFA 2006 : Proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA /

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores Corporativos: International Symposium for Testing and Failure Analysis Austin, Tex., Electronic Device Failure Analysis Society, ASM International
Formato: Electrónico Congresos, conferencias eBook
Idioma:Inglés
Publicado: Materials Park, OH : ASM International, 2006.
Temas:
Electronics > Materials > Testing > Congresses.
Electronic apparatus and appliances > Testing > Congresses.
Materials > Testing > Congresses.
Appareils électroniques > Essais > Congrès.
Matériaux > Essais > Congrès.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > General.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > Integrated.
Electronic apparatus and appliances > Testing.
Electronics > Materials > Testing.
Materials > Testing.
Conference papers and proceedings.
Acceso en línea:Texto completo

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