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|a International Symposium for Testing and Failure Analysis
|n (24th :
|d 1998 :
|c Dallas, Tex.)
|
| 245 |
1 |
0 |
|a ISTFA '98 :
|b proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas /
|c sponsored by ISFTA, ASM International.
|
| 246 |
3 |
0 |
|a Proceedings of the 24th International Symposium for Testing and Failure Analysis
|
| 246 |
3 |
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|a Conference proceedings from the 24th International Symposium for Testing and Failure Analysis
|
| 260 |
|
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|a Materials Park, OH :
|b ASM International,
|c ©1998.
|
| 300 |
|
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|a 1 online resource (xix, 490 pages) :
|b illustrations
|
| 336 |
|
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
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|a online resource
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|a Includes bibliographical references and index.
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|a Print version record.
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| 505 |
0 |
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|a Preface -- Table of Contents -- Index
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| 590 |
|
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|a eBooks on EBSCOhost
|b EBSCO eBook Subscription Academic Collection - Worldwide
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| 650 |
|
0 |
|a Electronics
|x Materials
|x Testing
|v Congresses.
|
| 650 |
|
0 |
|a Electronic apparatus and appliances
|x Testing
|v Congresses.
|
| 650 |
|
6 |
|a Appareils électroniques
|x Essais
|v Congrès.
|
| 650 |
|
7 |
|a TECHNOLOGY & ENGINEERING
|x Electronics
|x Circuits
|x General.
|2 bisacsh
|
| 650 |
|
7 |
|a TECHNOLOGY & ENGINEERING
|x Electronics
|x Circuits
|x Integrated.
|2 bisacsh
|
| 650 |
|
7 |
|a Electronic apparatus and appliances
|x Testing
|2 fast
|
| 650 |
|
7 |
|a Electronics
|x Materials
|x Testing
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| 655 |
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|a Conference papers and proceedings
|2 fast
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| 710 |
2 |
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|a ASM International.
|
| 776 |
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|i Print version:
|a International Symposium for Testing and Failure Analysis (24th : 1998 : Dallas, Tex.).
|t ISTFA '98.
|d Materials Park, OH : ASM International, ©1998
|w (DLC) 98073971
|
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