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Radiation effects and soft errors in integrated circuits and electronic devices /

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative en...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Schrimpf, Ronald Donald, Fleetwood, D. M. (Dan M.)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Singapore ; New Jersey : World Scientific Pub., ©2004.
Colección:Selected topics in electronics and systems ; vol. 34.
Temas:
Acceso en línea:Texto completo
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Publicado 2004
Texto completo
Electrónico eBook